Single-step dry-etched lateral PIN by using trench structure for optical mode switch

Ryan Imansyah, Luke Himbele, Haisong Jiang, Kiichi Hamamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Trench structure that enables lateral PIN with single-step dry-etching was exploited to optical mode switch for the first time. Successful current-injected (60mA) optical mode switching was confirmed with polarization independent characteristics.

Original languageEnglish
Title of host publication2015 International Conference on Photonics in Switching, PS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages232-234
Number of pages3
ISBN (Electronic)9781479988211
DOIs
Publication statusPublished - Nov 13 2015
EventInternational Conference on Photonics in Switching, PS 2015 - Florence, Italy
Duration: Sep 22 2015Sep 25 2015

Publication series

Name2015 International Conference on Photonics in Switching, PS 2015

Other

OtherInternational Conference on Photonics in Switching, PS 2015
CountryItaly
CityFlorence
Period9/22/159/25/15

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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