Site-specific stereograph of SiC(0001) surface by inverse matrix method

Fumihiko Matsui, Noriyuki Nishikayama, Naoyuki Maejima, Hirosuke Matsui, Kentaro Goto, Mie Hashimoto, Tomoaki Hatayama, Tomohiro Matsushita, Yukako Kato, Satoru Tanaka, Hiroshi Daimon

Research output: Contribution to journalArticle

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Abstract

The 2π-steradian (full hemisphere) Si 2p and C 1s photoelectron intensity angular distributions (PIADs) of the 6H-SiC(0001) surface 4° off towards the [11̄00] direction were measured. In a bulk crystal, pairs of mirrored local atomic sites with respect to the {11̄00} planes exist. Thus, a sixfold symmetry is expected for PIADs from the bulk. However, all the measured PIADs showed a threefold symmetry owing to the preferential appearance of terraces with one type of local atomic site caused by anisotropic step bunching along the [112̄0] direction. Taking the finite inelastic mean free path of photoelectrons into account, PIADs for one kind of Si and C atomic sites were successfully derived by solving an inverse matrix. Three strong forward focusing peaks due to nearby Si and C atoms have been separated from those formed by farther atoms. They showed a circular dichroism of rotational shift around the incident-light axis, which corresponds to the parallax in stereo viewing.

Original languageEnglish
Article number013601
Journaljournal of the physical society of japan
Volume80
Issue number1
DOIs
Publication statusPublished - Jan 1 2011

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matrix methods
photoelectrons
angular distribution
parallax
bunching
symmetry
hemispheres
mean free path
dichroism
atoms
shift
matrices
crystals

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Matsui, F., Nishikayama, N., Maejima, N., Matsui, H., Goto, K., Hashimoto, M., ... Daimon, H. (2011). Site-specific stereograph of SiC(0001) surface by inverse matrix method. journal of the physical society of japan, 80(1), [013601]. https://doi.org/10.1143/JPSJ.80.013601

Site-specific stereograph of SiC(0001) surface by inverse matrix method. / Matsui, Fumihiko; Nishikayama, Noriyuki; Maejima, Naoyuki; Matsui, Hirosuke; Goto, Kentaro; Hashimoto, Mie; Hatayama, Tomoaki; Matsushita, Tomohiro; Kato, Yukako; Tanaka, Satoru; Daimon, Hiroshi.

In: journal of the physical society of japan, Vol. 80, No. 1, 013601, 01.01.2011.

Research output: Contribution to journalArticle

Matsui, F, Nishikayama, N, Maejima, N, Matsui, H, Goto, K, Hashimoto, M, Hatayama, T, Matsushita, T, Kato, Y, Tanaka, S & Daimon, H 2011, 'Site-specific stereograph of SiC(0001) surface by inverse matrix method', journal of the physical society of japan, vol. 80, no. 1, 013601. https://doi.org/10.1143/JPSJ.80.013601
Matsui F, Nishikayama N, Maejima N, Matsui H, Goto K, Hashimoto M et al. Site-specific stereograph of SiC(0001) surface by inverse matrix method. journal of the physical society of japan. 2011 Jan 1;80(1). 013601. https://doi.org/10.1143/JPSJ.80.013601
Matsui, Fumihiko ; Nishikayama, Noriyuki ; Maejima, Naoyuki ; Matsui, Hirosuke ; Goto, Kentaro ; Hashimoto, Mie ; Hatayama, Tomoaki ; Matsushita, Tomohiro ; Kato, Yukako ; Tanaka, Satoru ; Daimon, Hiroshi. / Site-specific stereograph of SiC(0001) surface by inverse matrix method. In: journal of the physical society of japan. 2011 ; Vol. 80, No. 1.
@article{7c030888fb5c4d84a6459c210a578e33,
title = "Site-specific stereograph of SiC(0001) surface by inverse matrix method",
abstract = "The 2π-steradian (full hemisphere) Si 2p and C 1s photoelectron intensity angular distributions (PIADs) of the 6H-SiC(0001) surface 4° off towards the [11̄00] direction were measured. In a bulk crystal, pairs of mirrored local atomic sites with respect to the {11̄00} planes exist. Thus, a sixfold symmetry is expected for PIADs from the bulk. However, all the measured PIADs showed a threefold symmetry owing to the preferential appearance of terraces with one type of local atomic site caused by anisotropic step bunching along the [112̄0] direction. Taking the finite inelastic mean free path of photoelectrons into account, PIADs for one kind of Si and C atomic sites were successfully derived by solving an inverse matrix. Three strong forward focusing peaks due to nearby Si and C atoms have been separated from those formed by farther atoms. They showed a circular dichroism of rotational shift around the incident-light axis, which corresponds to the parallax in stereo viewing.",
author = "Fumihiko Matsui and Noriyuki Nishikayama and Naoyuki Maejima and Hirosuke Matsui and Kentaro Goto and Mie Hashimoto and Tomoaki Hatayama and Tomohiro Matsushita and Yukako Kato and Satoru Tanaka and Hiroshi Daimon",
year = "2011",
month = "1",
day = "1",
doi = "10.1143/JPSJ.80.013601",
language = "English",
volume = "80",
journal = "Journal of the Physical Society of Japan",
issn = "0031-9015",
publisher = "Physical Society of Japan",
number = "1",

}

TY - JOUR

T1 - Site-specific stereograph of SiC(0001) surface by inverse matrix method

AU - Matsui, Fumihiko

AU - Nishikayama, Noriyuki

AU - Maejima, Naoyuki

AU - Matsui, Hirosuke

AU - Goto, Kentaro

AU - Hashimoto, Mie

AU - Hatayama, Tomoaki

AU - Matsushita, Tomohiro

AU - Kato, Yukako

AU - Tanaka, Satoru

AU - Daimon, Hiroshi

PY - 2011/1/1

Y1 - 2011/1/1

N2 - The 2π-steradian (full hemisphere) Si 2p and C 1s photoelectron intensity angular distributions (PIADs) of the 6H-SiC(0001) surface 4° off towards the [11̄00] direction were measured. In a bulk crystal, pairs of mirrored local atomic sites with respect to the {11̄00} planes exist. Thus, a sixfold symmetry is expected for PIADs from the bulk. However, all the measured PIADs showed a threefold symmetry owing to the preferential appearance of terraces with one type of local atomic site caused by anisotropic step bunching along the [112̄0] direction. Taking the finite inelastic mean free path of photoelectrons into account, PIADs for one kind of Si and C atomic sites were successfully derived by solving an inverse matrix. Three strong forward focusing peaks due to nearby Si and C atoms have been separated from those formed by farther atoms. They showed a circular dichroism of rotational shift around the incident-light axis, which corresponds to the parallax in stereo viewing.

AB - The 2π-steradian (full hemisphere) Si 2p and C 1s photoelectron intensity angular distributions (PIADs) of the 6H-SiC(0001) surface 4° off towards the [11̄00] direction were measured. In a bulk crystal, pairs of mirrored local atomic sites with respect to the {11̄00} planes exist. Thus, a sixfold symmetry is expected for PIADs from the bulk. However, all the measured PIADs showed a threefold symmetry owing to the preferential appearance of terraces with one type of local atomic site caused by anisotropic step bunching along the [112̄0] direction. Taking the finite inelastic mean free path of photoelectrons into account, PIADs for one kind of Si and C atomic sites were successfully derived by solving an inverse matrix. Three strong forward focusing peaks due to nearby Si and C atoms have been separated from those formed by farther atoms. They showed a circular dichroism of rotational shift around the incident-light axis, which corresponds to the parallax in stereo viewing.

UR - http://www.scopus.com/inward/record.url?scp=78651275694&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=78651275694&partnerID=8YFLogxK

U2 - 10.1143/JPSJ.80.013601

DO - 10.1143/JPSJ.80.013601

M3 - Article

AN - SCOPUS:78651275694

VL - 80

JO - Journal of the Physical Society of Japan

JF - Journal of the Physical Society of Japan

SN - 0031-9015

IS - 1

M1 - 013601

ER -