Abstract
We present a novel touch-sensing system that detects the skin resistance of a touched finger using a static capacitive touch panel The employed frequency-scan method enables us to measure skin resistance regardless of touching conditions. The proposed system can create new touch-sensor applications such as multiuser system and bioelectrical sensing.
| Original language | English |
|---|---|
| Pages (from-to) | 1744-1747 |
| Number of pages | 4 |
| Journal | Digest of Technical Papers - SID International Symposium |
| Volume | 46 |
| Issue number | Book 3 |
| Publication status | Published - Jun 1 2015 |
| Event | 2015 SID International Symposium - San Jose, United States Duration: Jun 4 2015 → Jun 5 2015 |
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All Science Journal Classification (ASJC) codes
- Engineering(all)
Cite this
Skin resistance measurement using static capacitive touch panel. / Morimoto, Yuhei; Yoneda, Ryota; Hattori, Reiji.
In: Digest of Technical Papers - SID International Symposium, Vol. 46, No. Book 3, 01.06.2015, p. 1744-1747.Research output: Contribution to journal › Conference article
}
TY - JOUR
T1 - Skin resistance measurement using static capacitive touch panel
AU - Morimoto, Yuhei
AU - Yoneda, Ryota
AU - Hattori, Reiji
PY - 2015/6/1
Y1 - 2015/6/1
N2 - We present a novel touch-sensing system that detects the skin resistance of a touched finger using a static capacitive touch panel The employed frequency-scan method enables us to measure skin resistance regardless of touching conditions. The proposed system can create new touch-sensor applications such as multiuser system and bioelectrical sensing.
AB - We present a novel touch-sensing system that detects the skin resistance of a touched finger using a static capacitive touch panel The employed frequency-scan method enables us to measure skin resistance regardless of touching conditions. The proposed system can create new touch-sensor applications such as multiuser system and bioelectrical sensing.
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UR - http://www.scopus.com/inward/citedby.url?scp=84962702455&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:84962702455
VL - 46
SP - 1744
EP - 1747
JO - Digest of Technical Papers - SID International Symposium
JF - Digest of Technical Papers - SID International Symposium
SN - 0097-966X
IS - Book 3
ER -