Skin resistance measurement using static capacitive touch panel

Yuhei Morimoto; Ryota Yoneda; Reiji Hattori

doi:10.1002/sdtp.10219

Skin resistance measurement using static capacitive touch panel

Yuhei Morimoto, Ryota Yoneda, Reiji Hattori

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Abstract

We present a novel touch-sensing system that detects the skin resistance of a touched finger using a static capacitive touch panel The employed frequency-scan method enables us to measure skin resistance regardless of touching conditions. The proposed system can create new touch-sensor applications such as multiuser system and bioelectrical sensing.

Original language	English
Pages (from-to)	1744-1747
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	46
Issue number	Book 3
DOIs	https://doi.org/10.1002/sdtp.10219
Publication status	Published - Jun 1 2015
Event	2015 SID International Symposium - San Jose, United States Duration: Jun 4 2015 → Jun 5 2015

All Science Journal Classification (ASJC) codes

Engineering(all)

Access to Document

10.1002/sdtp.10219

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title = "Skin resistance measurement using static capacitive touch panel",

abstract = "We present a novel touch-sensing system that detects the skin resistance of a touched finger using a static capacitive touch panel The employed frequency-scan method enables us to measure skin resistance regardless of touching conditions. The proposed system can create new touch-sensor applications such as multiuser system and bioelectrical sensing.",

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AU - Yoneda, Ryota

AU - Hattori, Reiji

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N2 - We present a novel touch-sensing system that detects the skin resistance of a touched finger using a static capacitive touch panel The employed frequency-scan method enables us to measure skin resistance regardless of touching conditions. The proposed system can create new touch-sensor applications such as multiuser system and bioelectrical sensing.

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JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

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