Abstract
Slow noise processes, with characteristic timescales ∼1 s, have been studied in planar superconducting resonators. A frequency-locked loop is employed to track deviations of the resonator center frequency with high precision and bandwidth. Comparative measurements are made in varying microwave drive and temperature, and between bare resonators and those with an additional dielectric layer. All resonators are found to exhibit flicker frequency noise which increases with decreasing microwave drive. We also show that an increase in temperature results in a saturation of flicker noise in resonators with an additional dielectric layer, while bare resonators stop exhibiting flicker noise, instead showing a random frequency walk process.
| Original language | English |
|---|---|
| Article number | 140501 |
| Journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 87 |
| Issue number | 14 |
| DOIs | |
| Publication status | Published - Apr 5 2013 |
| Externally published | Yes |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
Cite this
Slow noise processes in superconducting resonators. / Burnett, J.; Lindström, T.; Oxborrow, M.; Harada, Y.; Sekine, Y.; Meeson, P.; Tzalenchuk, A. Ya.
In: Physical Review B - Condensed Matter and Materials Physics, Vol. 87, No. 14, 140501, 05.04.2013.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Slow noise processes in superconducting resonators
AU - Burnett, J.
AU - Lindström, T.
AU - Oxborrow, M.
AU - Harada, Y.
AU - Sekine, Y.
AU - Meeson, P.
AU - Tzalenchuk, A. Ya
PY - 2013/4/5
Y1 - 2013/4/5
N2 - Slow noise processes, with characteristic timescales ∼1 s, have been studied in planar superconducting resonators. A frequency-locked loop is employed to track deviations of the resonator center frequency with high precision and bandwidth. Comparative measurements are made in varying microwave drive and temperature, and between bare resonators and those with an additional dielectric layer. All resonators are found to exhibit flicker frequency noise which increases with decreasing microwave drive. We also show that an increase in temperature results in a saturation of flicker noise in resonators with an additional dielectric layer, while bare resonators stop exhibiting flicker noise, instead showing a random frequency walk process.
AB - Slow noise processes, with characteristic timescales ∼1 s, have been studied in planar superconducting resonators. A frequency-locked loop is employed to track deviations of the resonator center frequency with high precision and bandwidth. Comparative measurements are made in varying microwave drive and temperature, and between bare resonators and those with an additional dielectric layer. All resonators are found to exhibit flicker frequency noise which increases with decreasing microwave drive. We also show that an increase in temperature results in a saturation of flicker noise in resonators with an additional dielectric layer, while bare resonators stop exhibiting flicker noise, instead showing a random frequency walk process.
UR - http://www.scopus.com/inward/record.url?scp=84876180148&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84876180148&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.87.140501
DO - 10.1103/PhysRevB.87.140501
M3 - Article
AN - SCOPUS:84876180148
VL - 87
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
SN - 1098-0121
IS - 14
M1 - 140501
ER -