Soft X-ray measurement in IRE on the TST-2 spherical tokamak

K. Sasaki, K. Hanada, K. N. Sato, H. Zushi, K. Nakamura, M. Sakamoto, H. Idei, M. Hasegawa, S. Kawasaki, T. Nakashima, A. Higashijima, Y. Takase, A. Ejiri, S. Shiraiwa, H. Kasahara, T. Yamada, N. Nishino

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Internal Reconnection Event (IRE) is a characteristic relaxation phenomenon in STs (Sperical Tokamaks). To investigate the deformation of the plasma shape during IRE, four PIN diode arrays of 20 channels were installed on the TST-2@K (TST-2 at Kyushu University). Precursor of IRE was observed for several milli-seconds. The fluctuation was composed of two dominant components in frequency of 10kHz and 4kHz. The mode structure of 10kHz component is n/m=1/1 helical structure and 4kHz is n/m= 3/4. The overlap of modes (10kHz and 4kHz) was considered to be cause of IRE in TST-2 from the position and the growth of the modes.

Original languageEnglish
Title of host publication33rd EPS Conference on Plasma Physics 2006, EPS 2006 - Europhysics Conference Abstracts
Pages1640-1643
Number of pages4
Publication statusPublished - 2006
Event33rd European Physical Society Conference on Plasma Physics 2006, EPS 2006 - Rome, Italy
Duration: Jun 19 2006Jun 23 2006

Publication series

Name33rd EPS Conference on Plasma Physics 2006, EPS 2006
Volume3

Other

Other33rd European Physical Society Conference on Plasma Physics 2006, EPS 2006
Country/TerritoryItaly
CityRome
Period6/19/066/23/06

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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