TY - JOUR
T1 - Soft x-ray spectrum measurement of the ultralong discharge in the triam-1m tokamak
AU - Nagao, Akihiro
AU - Jotaki, Eriko
AU - Moriyama, Shin Ichi
AU - Nakamura, Kazuo
AU - Nakamura, Yukio
AU - Hiraki, Naoji
AU - Itoh, Satoshi
PY - 1989/8/1
Y1 - 1989/8/1
N2 - In order to evaluate the electron temperature and the effective charge number (Zeff) of the ultralong discharge by a lower hybrid current drive in the TRIAM-1M tokamak, the soft X-ray energy spectrum is measured by the pulse height analysis system. The accuracy of the electron temperatures determined by the soft X-ray spectrum measurements is confirmed by comparing with the temperature obtained by the Thomson scattering system for OH plasmas. We obtained a bulk electron temperature of about 1.5 keV and a Zeffvalue of about 2 during the long-term discharge. It was found that the impurities observed in the spectrum were Kα-lines of Fe, Cr and Ni originating from the stainless-steel limiter and they did not increase during the long-term discharge. Thus we obtained clean plasmas with relatively high temperature by a lower hybrid current drive.
AB - In order to evaluate the electron temperature and the effective charge number (Zeff) of the ultralong discharge by a lower hybrid current drive in the TRIAM-1M tokamak, the soft X-ray energy spectrum is measured by the pulse height analysis system. The accuracy of the electron temperatures determined by the soft X-ray spectrum measurements is confirmed by comparing with the temperature obtained by the Thomson scattering system for OH plasmas. We obtained a bulk electron temperature of about 1.5 keV and a Zeffvalue of about 2 during the long-term discharge. It was found that the impurities observed in the spectrum were Kα-lines of Fe, Cr and Ni originating from the stainless-steel limiter and they did not increase during the long-term discharge. Thus we obtained clean plasmas with relatively high temperature by a lower hybrid current drive.
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U2 - 10.1143/JJAP.28.1486
DO - 10.1143/JJAP.28.1486
M3 - Article
AN - SCOPUS:0024719784
SN - 0021-4922
VL - 28
SP - 1486
EP - 1490
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - 8R
ER -