Spatial resolution of synchrotron x-ray microtomography in high energy range: Effect of x-ray energy and sample-to-detector distance

D. Seo, F. Tomizato, H. Toda, K. Uesugi, A. Takeuchi, Y. Suzuki, M. Kobayashi

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Spatial resolution of three-dimensional images obtained by synchrotron X-ray microtomography technique is evaluated using cyclic bar patterns machined on a steel wire. Influences of X-ray energy and the sample-to-detector distance on spatial resolution were investigated. High X-ray energies of 33-78 keV are applied due to the high X-ray absorption of transition metals. Best spatial resolution of about 1.2 μm pitch was observed at the sample-to-detector distance range of 20-110 mm and at the energy range of 68-78 keV. Several factors such as X-ray scattering and diffraction phenomena affecting the degradation of spatial resolution are also discussed.

Original languageEnglish
Article number261901
JournalApplied Physics Letters
Volume101
Issue number26
DOIs
Publication statusPublished - Dec 24 2012
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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