Spin-polarization measurement of the secondary electrons emitted from silicon steel single crystal (001) surface

Kaoru Ijima, Seigi Mizuno, Naosuke Kawakami, Kazunobu Hayakawa

    Research output: Contribution to journalArticlepeer-review

    Abstract

    A spin-polarized scanning electron microscope (SP-SEM) which operates in reflection high energy electron diffraction (RHEED) mode of the primary electron beam has been developed. This apparatus opens a way to relate the magnetic domain structures with the surface crystal structure directly. This report describes the observation of SP-SEM images with corresponding RHEED patterns of a silicon steel single crystal (001) surface.

    Original languageEnglish
    Pages (from-to)357-360
    Number of pages4
    JournalShinku/Journal of the Vacuum Society of Japan
    Volume42
    Issue number3
    DOIs
    Publication statusPublished - 1999

    All Science Journal Classification (ASJC) codes

    • Condensed Matter Physics
    • Surfaces, Coatings and Films
    • Electrical and Electronic Engineering

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