Spin-polarization measurement of the secondary electrons emitted from silicon steel single crystal (001) surface

Kaoru Ijima, Seigi Mizuno, Naosuke Kawakami, Kazunobu Hayakawa

    Research output: Contribution to journalArticle

    Abstract

    A spin-polarized scanning electron microscope (SP-SEM) which operates in reflection high energy electron diffraction (RHEED) mode of the primary electron beam has been developed. This apparatus opens a way to relate the magnetic domain structures with the surface crystal structure directly. This report describes the observation of SP-SEM images with corresponding RHEED patterns of a silicon steel single crystal (001) surface.

    Original languageEnglish
    Pages (from-to)357-360
    Number of pages4
    JournalShinku/Journal of the Vacuum Society of Japan
    Volume42
    Issue number3
    DOIs
    Publication statusPublished - Jan 1 1999

    Fingerprint

    Single crystal surfaces
    Silicon steel
    Spin polarization
    Reflection high energy electron diffraction
    crystal surfaces
    high energy electrons
    Electron microscopes
    electron diffraction
    electron microscopes
    steels
    Scanning
    Magnetic domains
    scanning
    Electrons
    single crystals
    silicon
    polarization
    magnetic domains
    Diffraction patterns
    Electron beams

    All Science Journal Classification (ASJC) codes

    • Condensed Matter Physics
    • Surfaces, Coatings and Films
    • Electrical and Electronic Engineering

    Cite this

    Spin-polarization measurement of the secondary electrons emitted from silicon steel single crystal (001) surface. / Ijima, Kaoru; Mizuno, Seigi; Kawakami, Naosuke; Hayakawa, Kazunobu.

    In: Shinku/Journal of the Vacuum Society of Japan, Vol. 42, No. 3, 01.01.1999, p. 357-360.

    Research output: Contribution to journalArticle

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