Spontaneous emergence of free carrier at phase transitions of insulating BaTiO3 single crystals: Experimental analyses

Mizuki Yamato, Yosuke Urakami, Daisuke Matsumoto, Hirotaka Yoshioka, Yukio Watanabe

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The conductance of BaTiO 3 and the relaxor single crystals is measured. Unlike conventional insulators, the stoichiometric crystals in which the conductance due to the impurities are rendered negligible exhibit an intrinsic conductance that is manifested as the sharp peaks at the phase transitions, and the peaks become evident with purity, and its values are nearly independent of the samples that are grown by the different methods and the conditions, whereas the conductance above T C depends critically on the samples. Especially, these findings are verified by the measurements of the current at constant voltages. These observations elucidate that the ferroelectrics posses a carrier generation mechanism, which has been invisible in semiconducting samples.

Original languageEnglish
Pages (from-to)169-180
Number of pages12
JournalFerroelectrics
Volume336
DOIs
Publication statusPublished - Jul 1 2006

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Ferroelectric materials
Phase transitions
Single crystals
Impurities
Crystals
single crystals
Electric potential
purity
insulators
impurities
electric potential
crystals

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Spontaneous emergence of free carrier at phase transitions of insulating BaTiO3 single crystals : Experimental analyses. / Yamato, Mizuki; Urakami, Yosuke; Matsumoto, Daisuke; Yoshioka, Hirotaka; Watanabe, Yukio.

In: Ferroelectrics, Vol. 336, 01.07.2006, p. 169-180.

Research output: Contribution to journalArticle

Yamato, Mizuki ; Urakami, Yosuke ; Matsumoto, Daisuke ; Yoshioka, Hirotaka ; Watanabe, Yukio. / Spontaneous emergence of free carrier at phase transitions of insulating BaTiO3 single crystals : Experimental analyses. In: Ferroelectrics. 2006 ; Vol. 336. pp. 169-180.
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