Abstract
We used low-energy electron microscopy (LEEM) and scanning tunneling microscopy (STM) to investigate domain structures of epitaxial few-layer graphene grown on SiC(0001). Dark-field (DF) LEEM images formed using (10) and (01) beams clearly indicate that bilayer graphene consists of two types of domains, which have threefold symmetry and are rotated by 180°with respect to each other. The DF LEEM images show clear domain contrasts at energies where (10)- and (01)-beam intensities calculated for bulk graphite are largely different. This means that the two types of domains are different in stacking: AB and AC stackings. The stacking domains are also supported by the STM images of bilayer graphene showing both hexagonal and honeycomb patterns.
| Original language | English |
|---|---|
| Article number | 085406 |
| Journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 80 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - Aug 6 2009 |
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All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Electronic, Optical and Magnetic Materials
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Stacking domains of epitaxial few-layer graphene on SiC(0001). / Hibino, H.; Mizuno, Seigi; Kageshima, H.; Nagase, M.; Yamaguchi, H.
In: Physical Review B - Condensed Matter and Materials Physics, Vol. 80, No. 8, 085406, 06.08.2009.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Stacking domains of epitaxial few-layer graphene on SiC(0001)
AU - Hibino, H.
AU - Mizuno, Seigi
AU - Kageshima, H.
AU - Nagase, M.
AU - Yamaguchi, H.
PY - 2009/8/6
Y1 - 2009/8/6
N2 - We used low-energy electron microscopy (LEEM) and scanning tunneling microscopy (STM) to investigate domain structures of epitaxial few-layer graphene grown on SiC(0001). Dark-field (DF) LEEM images formed using (10) and (01) beams clearly indicate that bilayer graphene consists of two types of domains, which have threefold symmetry and are rotated by 180°with respect to each other. The DF LEEM images show clear domain contrasts at energies where (10)- and (01)-beam intensities calculated for bulk graphite are largely different. This means that the two types of domains are different in stacking: AB and AC stackings. The stacking domains are also supported by the STM images of bilayer graphene showing both hexagonal and honeycomb patterns.
AB - We used low-energy electron microscopy (LEEM) and scanning tunneling microscopy (STM) to investigate domain structures of epitaxial few-layer graphene grown on SiC(0001). Dark-field (DF) LEEM images formed using (10) and (01) beams clearly indicate that bilayer graphene consists of two types of domains, which have threefold symmetry and are rotated by 180°with respect to each other. The DF LEEM images show clear domain contrasts at energies where (10)- and (01)-beam intensities calculated for bulk graphite are largely different. This means that the two types of domains are different in stacking: AB and AC stackings. The stacking domains are also supported by the STM images of bilayer graphene showing both hexagonal and honeycomb patterns.
UR - http://www.scopus.com/inward/record.url?scp=70349453623&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=70349453623&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.80.085406
DO - 10.1103/PhysRevB.80.085406
M3 - Article
AN - SCOPUS:70349453623
VL - 80
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
SN - 1098-0121
IS - 8
M1 - 085406
ER -