Statistical investigation on the design of field emitter array

Tomoya Yoshida, Akiyoshi Baba, Tanemasa Asano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We proposed the estimation method which gives the required number of field emitter tips in a pixel to obtain highly uniform pixels. We evaluated our previously proposed single-tip gated-cold cathode using this method. Reduction of a fluctuation (σ/μ) of an emission current from tip to tip is more important than improvement of an active tip ratio (R) in order to decrease a number of emitter tips in a pixel. (Figure Presented).

Original languageEnglish
Title of host publicationIVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium
Pages43-44
Number of pages2
DOIs
Publication statusPublished - Dec 1 2006
Event19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006 - Guilin, China
Duration: Jul 17 2006Jul 20 2006

Publication series

NameIVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium

Other

Other19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006
CountryChina
CityGuilin
Period7/17/067/20/06

Fingerprint

Pixels
Cathodes

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Yoshida, T., Baba, A., & Asano, T. (2006). Statistical investigation on the design of field emitter array. In IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium (pp. 43-44). [4134450] (IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium). https://doi.org/10.1109/IVNC.2006.335343

Statistical investigation on the design of field emitter array. / Yoshida, Tomoya; Baba, Akiyoshi; Asano, Tanemasa.

IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium. 2006. p. 43-44 4134450 (IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yoshida, T, Baba, A & Asano, T 2006, Statistical investigation on the design of field emitter array. in IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium., 4134450, IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, pp. 43-44, 19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006, Guilin, China, 7/17/06. https://doi.org/10.1109/IVNC.2006.335343
Yoshida T, Baba A, Asano T. Statistical investigation on the design of field emitter array. In IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium. 2006. p. 43-44. 4134450. (IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium). https://doi.org/10.1109/IVNC.2006.335343
Yoshida, Tomoya ; Baba, Akiyoshi ; Asano, Tanemasa. / Statistical investigation on the design of field emitter array. IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium. 2006. pp. 43-44 (IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium).
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