Step-heating dilatometry method to measure the change in length due to annealing of a SiC temperature monitor

Toyohiko Yano, Kazunari Sasaki, Tadashi Maruyama, Takayoshi Iseki, Masahiko Ito, Shoji Onose

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

A simple method to measure the change in length of a silicon carbide temperature monitor due to annealing is presented. A differential dilatometer is used to detect the change in length of an irradiated specimen as the temperature of the specimen is raised in steps. The results obtained by this step-heating dilatometry method are in good agreement with measurements obtained with an X-ray diffractometer and a micrometer.

Original languageEnglish
Pages (from-to)412-415
Number of pages4
JournalNuclear Technology
Volume93
Issue number3
DOIs
Publication statusPublished - Jan 1 1991
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Condensed Matter Physics

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