Abstract
A simple method to measure the change in length of a silicon carbide temperature monitor due to annealing is presented. A differential dilatometer is used to detect the change in length of an irradiated specimen as the temperature of the specimen is raised in steps. The results obtained by this step-heating dilatometry method are in good agreement with measurements obtained with an X-ray diffractometer and a micrometer.
Original language | English |
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Pages (from-to) | 412-415 |
Number of pages | 4 |
Journal | Nuclear Technology |
Volume | 93 |
Issue number | 3 |
DOIs | |
Publication status | Published - Jan 1 1991 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Condensed Matter Physics