A simple method to measure the change in length of a silicon carbide temperature monitor due to annealing is presented. A differential dilatometer is used to detect the change in length of an irradiated specimen as the temperature of the specimen is raised in steps. The results obtained by this step-heating dilatometry method are in good agreement with measurements obtained with an X-ray diffractometer and a micrometer.
|Number of pages||4|
|Publication status||Published - Jan 1 1991|
All Science Journal Classification (ASJC) codes
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Condensed Matter Physics