Strain Field Around Lomer Sessile Dislocations in Silicon Measured using Geometric Phase Analysis

Damar Rastri Adhika, Masaki Tanaka, Tomokazu Yamamoto, Kenji Higashida

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)227-233
Number of pages7
JournalTransactions of the Materials Research Society of Japan
Volume40
Issue number3
DOIs
Publication statusPublished - Sep 2015

Cite this

Strain Field Around Lomer Sessile Dislocations in Silicon Measured using Geometric Phase Analysis. / Adhika, Damar Rastri; Tanaka, Masaki; Yamamoto, Tomokazu; Higashida, Kenji.

In: Transactions of the Materials Research Society of Japan, Vol. 40, No. 3, 09.2015, p. 227-233.

Research output: Contribution to journalArticle

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