Structural analysis of R and D division from patent documents

Yurie Iino; Yasuhiro Yamada; Sachio Hirokawa

doi:10.1109/ICEBE.2008.29

Structural analysis of R and D division from patent documents

Yurie Iino, Yasuhiro Yamada, Sachio Hirokawa

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

This paper describes a method to draw the network of inventors and their technology. It is based on the co-occurrence analysis of inventors of a company described in their patent documents. Empirical evaluation, using 16,375 cosmetic related patent documents, shows that the method discloses the structure of research and development activities of companies.

Original language	English
Title of host publication	IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops
Subtitle of host publication	AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08
Pages	423-428
Number of pages	6
DOIs	https://doi.org/10.1109/ICEBE.2008.29
Publication status	Published - 2008
Event	IEEE International Conference on e-Business Engineering, ICEBE'08 - Xi'an, China Duration: Oct 22 2008 → Oct 24 2008

Publication series

Name	IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08

Other

Other	IEEE International Conference on e-Business Engineering, ICEBE'08
Country	China
City	Xi'an
Period	10/22/08 → 10/24/08

All Science Journal Classification (ASJC) codes

Management of Technology and Innovation
Computer Networks and Communications
Software

Access to Document

10.1109/ICEBE.2008.29

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Cite this

Iino, Y., Yamada, Y., & Hirokawa, S. (2008). Structural analysis of R and D division from patent documents. In IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08 (pp. 423-428). [4690646] (IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08). https://doi.org/10.1109/ICEBE.2008.29

Structural analysis of R and D division from patent documents. / Iino, Yurie; Yamada, Yasuhiro; Hirokawa, Sachio.

IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08. 2008. p. 423-428 4690646 (IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Iino, Y, Yamada, Y & Hirokawa, S 2008, Structural analysis of R and D division from patent documents. in IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08., 4690646, IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08, pp. 423-428, IEEE International Conference on e-Business Engineering, ICEBE'08, Xi'an, China, 10/22/08. https://doi.org/10.1109/ICEBE.2008.29

Iino Y, Yamada Y, Hirokawa S. Structural analysis of R and D division from patent documents. In IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08. 2008. p. 423-428. 4690646. (IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08). https://doi.org/10.1109/ICEBE.2008.29

Iino, Yurie ; Yamada, Yasuhiro ; Hirokawa, Sachio. / Structural analysis of R and D division from patent documents. IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08. 2008. pp. 423-428 (IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08).

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