Structural analysis of R and D division from patent documents

Yurie Iino, Yasuhiro Yamada, Sachio Hirokawa

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    This paper describes a method to draw the network of inventors and their technology. It is based on the co-occurrence analysis of inventors of a company described in their patent documents. Empirical evaluation, using 16,375 cosmetic related patent documents, shows that the method discloses the structure of research and development activities of companies.

    Original languageEnglish
    Title of host publicationIEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops
    Subtitle of host publicationAiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08
    Pages423-428
    Number of pages6
    DOIs
    Publication statusPublished - 2008
    EventIEEE International Conference on e-Business Engineering, ICEBE'08 - Xi'an, China
    Duration: Oct 22 2008Oct 24 2008

    Publication series

    NameIEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08

    Other

    OtherIEEE International Conference on e-Business Engineering, ICEBE'08
    CountryChina
    CityXi'an
    Period10/22/0810/24/08

    All Science Journal Classification (ASJC) codes

    • Management of Technology and Innovation
    • Computer Networks and Communications
    • Software

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