TY - GEN
T1 - Structural analysis of R and D division from patent documents
AU - Iino, Yurie
AU - Yamada, Yasuhiro
AU - Hirokawa, Sachio
PY - 2008
Y1 - 2008
N2 - This paper describes a method to draw the network of inventors and their technology. It is based on the co-occurrence analysis of inventors of a company described in their patent documents. Empirical evaluation, using 16,375 cosmetic related patent documents, shows that the method discloses the structure of research and development activities of companies.
AB - This paper describes a method to draw the network of inventors and their technology. It is based on the co-occurrence analysis of inventors of a company described in their patent documents. Empirical evaluation, using 16,375 cosmetic related patent documents, shows that the method discloses the structure of research and development activities of companies.
UR - http://www.scopus.com/inward/record.url?scp=58149085064&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=58149085064&partnerID=8YFLogxK
U2 - 10.1109/ICEBE.2008.29
DO - 10.1109/ICEBE.2008.29
M3 - Conference contribution
AN - SCOPUS:58149085064
SN - 9780769533957
T3 - IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08
SP - 423
EP - 428
BT - IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops
T2 - IEEE International Conference on e-Business Engineering, ICEBE'08
Y2 - 22 October 2008 through 24 October 2008
ER -