Structural analysis of R and D division from patent documents

Yurie Iino, Yasuhiro Yamada, Sachio Hirokawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper describes a method to draw the network of inventors and their technology. It is based on the co-occurrence analysis of inventors of a company described in their patent documents. Empirical evaluation, using 16,375 cosmetic related patent documents, shows that the method discloses the structure of research and development activities of companies.

Original languageEnglish
Title of host publicationIEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08
Pages423-428
Number of pages6
DOIs
Publication statusPublished - 2008
EventIEEE International Conference on e-Business Engineering, ICEBE'08 - Xi'an, China
Duration: Oct 22 2008Oct 24 2008

Other

OtherIEEE International Conference on e-Business Engineering, ICEBE'08
CountryChina
CityXi'an
Period10/22/0810/24/08

Fingerprint

Structural analysis
Cosmetics
Industry
Patents
Inventor
Empirical evaluation

All Science Journal Classification (ASJC) codes

  • Management of Technology and Innovation
  • Computer Networks and Communications
  • Software

Cite this

Iino, Y., Yamada, Y., & Hirokawa, S. (2008). Structural analysis of R and D division from patent documents. In IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08 (pp. 423-428). [4690646] https://doi.org/10.1109/ICEBE.2008.29

Structural analysis of R and D division from patent documents. / Iino, Yurie; Yamada, Yasuhiro; Hirokawa, Sachio.

IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08. 2008. p. 423-428 4690646.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Iino, Y, Yamada, Y & Hirokawa, S 2008, Structural analysis of R and D division from patent documents. in IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08., 4690646, pp. 423-428, IEEE International Conference on e-Business Engineering, ICEBE'08, Xi'an, China, 10/22/08. https://doi.org/10.1109/ICEBE.2008.29
Iino Y, Yamada Y, Hirokawa S. Structural analysis of R and D division from patent documents. In IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08. 2008. p. 423-428. 4690646 https://doi.org/10.1109/ICEBE.2008.29
Iino, Yurie ; Yamada, Yasuhiro ; Hirokawa, Sachio. / Structural analysis of R and D division from patent documents. IEEE International Conference on e-Business Engineering, ICEBE'08 - Workshops: AiR'08, EM2I'08, SOAIC'08, SOKM'08, BIMA'08, DKEEE'08. 2008. pp. 423-428
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