Structural and analytical characterization of as-grown MgB2 film sputtered on differently oriented α-Al2O3 substrate

W. J. Moon, K. Kaneko, S. Toh, M. Saunders, A. Saito, Z. Wang, H. Abe, M. Naito

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4 Citations (Scopus)

Abstract

Superconducting MgB2 films were prepared on differently oriented α-Al2O3 substrates, C- and R-planes, which yielded superconducting transition temperatures of about 28 K. The electric resistivity of the MgB2 film deposited on an R-plane substrate is 300 μΩ cm, six times larger than that on a C-plane substrate, 50 μΩ cm. To understand these differences in the electrical properties, various transmission electron microscopes were used to carry out a structural and the compositional analysis. It was shown from selected-area electron diffraction patterns that the microstructure consists of a mixture of columnar MgB2 grains and amorphous phases in the case of the R-plane specimen, while no amorphous phase was present in the case of the C-plane specimen.

Original languageEnglish
Pages (from-to)92-100
Number of pages9
JournalSuperconductor Science and Technology
Volume18
Issue number1
DOIs
Publication statusPublished - Jan 1 2005

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

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