Structural and analytical characterization of as-grown MgB2 film sputtered on differently oriented α-Al2O3 substrate

W. J. Moon, Kenji Kaneko, S. Toh, M. Saunders, A. Saito, Z. Wang, H. Abe, M. Naito

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Superconducting MgB2 films were prepared on differently oriented α-Al2O3 substrates, C- and R-planes, which yielded superconducting transition temperatures of about 28 K. The electric resistivity of the MgB2 film deposited on an R-plane substrate is 300 μΩ cm, six times larger than that on a C-plane substrate, 50 μΩ cm. To understand these differences in the electrical properties, various transmission electron microscopes were used to carry out a structural and the compositional analysis. It was shown from selected-area electron diffraction patterns that the microstructure consists of a mixture of columnar MgB2 grains and amorphous phases in the case of the R-plane specimen, while no amorphous phase was present in the case of the C-plane specimen.

Original languageEnglish
Pages (from-to)92-100
Number of pages9
JournalSuperconductor Science and Technology
Volume18
Issue number1
DOIs
Publication statusPublished - Jan 1 2005

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Substrates
Superconducting films
Electric conductivity
superconducting films
Electron diffraction
Diffraction patterns
Superconducting transition temperature
Electric properties
Electron microscopes
diffraction patterns
electron diffraction
electron microscopes
transition temperature
electrical properties
microstructure
Microstructure
electrical resistivity

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

Structural and analytical characterization of as-grown MgB2 film sputtered on differently oriented α-Al2O3 substrate. / Moon, W. J.; Kaneko, Kenji; Toh, S.; Saunders, M.; Saito, A.; Wang, Z.; Abe, H.; Naito, M.

In: Superconductor Science and Technology, Vol. 18, No. 1, 01.01.2005, p. 92-100.

Research output: Contribution to journalArticle

Moon, W. J. ; Kaneko, Kenji ; Toh, S. ; Saunders, M. ; Saito, A. ; Wang, Z. ; Abe, H. ; Naito, M. / Structural and analytical characterization of as-grown MgB2 film sputtered on differently oriented α-Al2O3 substrate. In: Superconductor Science and Technology. 2005 ; Vol. 18, No. 1. pp. 92-100.
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AU - Wang, Z.

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