Structural and compositional characterization of N 2 -H 2 plasma surface-treated TiO 2 thin films

L. Miao, S. Tanemura, H. Watanabe, S. Toh, Kenji Kaneko

Research output: Contribution to journalConference article

11 Citations (Scopus)

Abstract

The structural and compositional properties of three samples such as as-deposited single-phase anatase-TiO 2 polycrystalline thin films on slide glass substrates (No. 1), the sample surface-treated by N 2 -H 2 mixed-gases plasma (No. 2), and the sample being additionally anneal-treated in N 2 gases (No. 3), are characterized by transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy (EDS). The primitive lattice cells of three thin films are verified as distorted in comparison with that of bulk from the TEM results. This distortion of primitive lattice cell causes the increase of optical band gap for the films when we compared it with that of bulk, while the decrease of optical band gap should be attributed to the substitution of N into TiO 2 . Higher concentration of nitrogen in sample No. 3 is confirmed by line-EDS profiles under scanning TEM (STEM) when compared with sample No. 2 and this confirms that plasma surface treatment is an effective way for N-doping in TiO 2 .

Original languageEnglish
Pages (from-to)412-417
Number of pages6
JournalApplied Surface Science
Volume244
Issue number1-4
DOIs
Publication statusPublished - May 15 2005
Event12th International Conference on Solid Films and Surfaces - Hammatsu, Japan
Duration: Jun 21 2004Jun 25 2004

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Optical band gaps
Transmission electron microscopy
Plasmas
Thin films
Energy dispersive spectroscopy
Plasma Gases
Gases
Titanium dioxide
Surface treatment
Substitution reactions
Nitrogen
Doping (additives)
Glass
Scanning electron microscopy
Substrates
titanium dioxide
X-Ray Emission Spectrometry

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

Cite this

Structural and compositional characterization of N 2 -H 2 plasma surface-treated TiO 2 thin films . / Miao, L.; Tanemura, S.; Watanabe, H.; Toh, S.; Kaneko, Kenji.

In: Applied Surface Science, Vol. 244, No. 1-4, 15.05.2005, p. 412-417.

Research output: Contribution to journalConference article

Miao, L. ; Tanemura, S. ; Watanabe, H. ; Toh, S. ; Kaneko, Kenji. / Structural and compositional characterization of N 2 -H 2 plasma surface-treated TiO 2 thin films In: Applied Surface Science. 2005 ; Vol. 244, No. 1-4. pp. 412-417.
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AU - Kaneko, Kenji

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N2 - The structural and compositional properties of three samples such as as-deposited single-phase anatase-TiO 2 polycrystalline thin films on slide glass substrates (No. 1), the sample surface-treated by N 2 -H 2 mixed-gases plasma (No. 2), and the sample being additionally anneal-treated in N 2 gases (No. 3), are characterized by transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy (EDS). The primitive lattice cells of three thin films are verified as distorted in comparison with that of bulk from the TEM results. This distortion of primitive lattice cell causes the increase of optical band gap for the films when we compared it with that of bulk, while the decrease of optical band gap should be attributed to the substitution of N into TiO 2 . Higher concentration of nitrogen in sample No. 3 is confirmed by line-EDS profiles under scanning TEM (STEM) when compared with sample No. 2 and this confirms that plasma surface treatment is an effective way for N-doping in TiO 2 .

AB - The structural and compositional properties of three samples such as as-deposited single-phase anatase-TiO 2 polycrystalline thin films on slide glass substrates (No. 1), the sample surface-treated by N 2 -H 2 mixed-gases plasma (No. 2), and the sample being additionally anneal-treated in N 2 gases (No. 3), are characterized by transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy (EDS). The primitive lattice cells of three thin films are verified as distorted in comparison with that of bulk from the TEM results. This distortion of primitive lattice cell causes the increase of optical band gap for the films when we compared it with that of bulk, while the decrease of optical band gap should be attributed to the substitution of N into TiO 2 . Higher concentration of nitrogen in sample No. 3 is confirmed by line-EDS profiles under scanning TEM (STEM) when compared with sample No. 2 and this confirms that plasma surface treatment is an effective way for N-doping in TiO 2 .

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