Structural and optical properties of AlN grown by solid source solution growth method

Yoshihiro Kangawa, Hiroshige Suetsugu, Michael Knetzger, Elke Meissner, Kouji Hazu, Shigefusa F. Chichibu, Takashi Kajiwara, Satoru Tanaka, Yosuke Iwasaki, Koichi Kakimoto

Research output: Contribution to journalArticle

Abstract

Structural and optical properties of AlN grown on AlN(0001) by the solid source solution growth (3SG) method were investigated. Transmission electron microscopy (TEM) analysis revealed that the geometrical relationship between the growth directions and slip planes influenced the dislocation propagation behaviors and annihilation mechanisms. Panchromatic and monochromatic images in the cathodoluminescence (CL) spectrum further revealed that C impurities were segregated near the surface, while Al vacancies were widely distributed in the AlN/AlN(0001) grown using the 3SG method.

Original languageEnglish
Article number085501
JournalJapanese Journal of Applied Physics
Volume54
Issue number8
DOIs
Publication statusPublished - Aug 1 2015

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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