Domain wall (DW) pinning properties in Fe crossbar junctions with various nominal bar widths (100-380 nm) and film thicknesses (10-30 nm) are studied by magnetic force microscopy observation and micromagnetic simulation. The measured DW depinning fields present the marked bar width dependence as predicted from micromagnetic simulations. Simulation results suggest that the transverse DW is stabilized at the cross junction, and the depinning process is triggered by nonuniform magnetization rotation, taking the temporal buckling configuration.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering