Structural determination of indium-induced Si(111) reconstructed surfaces by LEED analysis

(√3×√3)R30° and (4×1)

Seigi Mizuno, Y. O. Mizuno, H. Tochihara

    Research output: Contribution to journalArticle

    46 Citations (Scopus)

    Abstract

    Two indium-induced Si(111) reconstructed surfaces, the (√3×√×)R30° and the (4×1) structures, were examined by dynamical low-energy electron diffraction I-V analysis. As suggested in former studies, the T4 model of the (√3×√3)R30° structure showed the best agreement with the experiments. For the (4×1) structure, we examined 45 models and selected the model proposed by a surface x-ray diffraction study as the most appropriate structure. The low-temperature phase, whose diffraction pattern is (8×1)-p1g1 with half-order streaks, has I-V curves almost identical to those of the (4×1) phase. Therefore, the structural changes accompanying a phase transition between the (4×1) and (8×1)-p1g1 structures should be very small.

    Original languageEnglish
    Article number195410
    Pages (from-to)1954101-1954108
    Number of pages8
    JournalPhysical Review B - Condensed Matter and Materials Physics
    Volume67
    Issue number19
    Publication statusPublished - May 2003

    Fingerprint

    Indium
    indium
    Low energy electron diffraction
    Diffraction patterns
    x ray diffraction
    diffraction patterns
    electron diffraction
    Diffraction
    Phase transitions
    X rays
    curves
    Experiments
    Temperature
    energy

    All Science Journal Classification (ASJC) codes

    • Condensed Matter Physics

    Cite this

    Structural determination of indium-induced Si(111) reconstructed surfaces by LEED analysis : (√3×√3)R30° and (4×1). / Mizuno, Seigi; Mizuno, Y. O.; Tochihara, H.

    In: Physical Review B - Condensed Matter and Materials Physics, Vol. 67, No. 19, 195410, 05.2003, p. 1954101-1954108.

    Research output: Contribution to journalArticle

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