Structural determination of indium-induced Si(111) reconstructed surfaces by LEED analysis

(formula presented) and (4×1)

Seigi Mizuno, Y. O. Mizuno, H. Tochihara

    Research output: Contribution to journalArticle

    2 Citations (Scopus)

    Abstract

    Two indium-induced Si(111) reconstructed surfaces, the (Formula presented) and the (4×1) structures, were examined by dynamical low-energy electron diffraction I − V analysis. As suggested in former studies, the T4 model of the (Formula presented) structure showed the best agreement with the experiments. For the (4×1) structure, we examined 45 models and selected the model proposed by a surface x-ray diffraction study as the most appropriate structure. The low-temperature phase, whose diffraction pattern is (8 × 1) − p1g1 with half-order streaks, has I − V curves almost identical to those of the (4×1) phase. Therefore, the structural changes accompanying a phase transition between the (4×1) and (8 × 1) − p1g1 structures should be very small.

    Original languageEnglish
    JournalPhysical Review B - Condensed Matter and Materials Physics
    Volume67
    Issue number19
    DOIs
    Publication statusPublished - May 20 2003

    Fingerprint

    Indium
    indium
    Low energy electron diffraction
    Diffraction patterns
    x ray diffraction
    diffraction patterns
    electron diffraction
    Diffraction
    Phase transitions
    X rays
    curves
    Experiments
    Temperature
    energy

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

    Cite this

    @article{6027f965b3a2484bb6c6c20b789035bd,
    title = "Structural determination of indium-induced Si(111) reconstructed surfaces by LEED analysis: (formula presented) and (4×1)",
    abstract = "Two indium-induced Si(111) reconstructed surfaces, the (Formula presented) and the (4×1) structures, were examined by dynamical low-energy electron diffraction I − V analysis. As suggested in former studies, the T4 model of the (Formula presented) structure showed the best agreement with the experiments. For the (4×1) structure, we examined 45 models and selected the model proposed by a surface x-ray diffraction study as the most appropriate structure. The low-temperature phase, whose diffraction pattern is (8 × 1) − p1g1 with half-order streaks, has I − V curves almost identical to those of the (4×1) phase. Therefore, the structural changes accompanying a phase transition between the (4×1) and (8 × 1) − p1g1 structures should be very small.",
    author = "Seigi Mizuno and Mizuno, {Y. O.} and H. Tochihara",
    year = "2003",
    month = "5",
    day = "20",
    doi = "10.1103/PhysRevB.67.195410",
    language = "English",
    volume = "67",
    journal = "Physical Review B - Condensed Matter and Materials Physics",
    issn = "1098-0121",
    publisher = "American Physical Society",
    number = "19",

    }

    TY - JOUR

    T1 - Structural determination of indium-induced Si(111) reconstructed surfaces by LEED analysis

    T2 - (formula presented) and (4×1)

    AU - Mizuno, Seigi

    AU - Mizuno, Y. O.

    AU - Tochihara, H.

    PY - 2003/5/20

    Y1 - 2003/5/20

    N2 - Two indium-induced Si(111) reconstructed surfaces, the (Formula presented) and the (4×1) structures, were examined by dynamical low-energy electron diffraction I − V analysis. As suggested in former studies, the T4 model of the (Formula presented) structure showed the best agreement with the experiments. For the (4×1) structure, we examined 45 models and selected the model proposed by a surface x-ray diffraction study as the most appropriate structure. The low-temperature phase, whose diffraction pattern is (8 × 1) − p1g1 with half-order streaks, has I − V curves almost identical to those of the (4×1) phase. Therefore, the structural changes accompanying a phase transition between the (4×1) and (8 × 1) − p1g1 structures should be very small.

    AB - Two indium-induced Si(111) reconstructed surfaces, the (Formula presented) and the (4×1) structures, were examined by dynamical low-energy electron diffraction I − V analysis. As suggested in former studies, the T4 model of the (Formula presented) structure showed the best agreement with the experiments. For the (4×1) structure, we examined 45 models and selected the model proposed by a surface x-ray diffraction study as the most appropriate structure. The low-temperature phase, whose diffraction pattern is (8 × 1) − p1g1 with half-order streaks, has I − V curves almost identical to those of the (4×1) phase. Therefore, the structural changes accompanying a phase transition between the (4×1) and (8 × 1) − p1g1 structures should be very small.

    UR - http://www.scopus.com/inward/record.url?scp=85039030674&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=85039030674&partnerID=8YFLogxK

    U2 - 10.1103/PhysRevB.67.195410

    DO - 10.1103/PhysRevB.67.195410

    M3 - Article

    VL - 67

    JO - Physical Review B - Condensed Matter and Materials Physics

    JF - Physical Review B - Condensed Matter and Materials Physics

    SN - 1098-0121

    IS - 19

    ER -