Structural investigation on implanted copper ions in silica glass by XAFS spectroscopy

Kohei Fukumi, Akiyoshi Chayahara, Kohei Kadono, Hiroyuki Kageyama, Tomoko Akai, Naoyuki Kitamura, Masaki Makihara, Kanenaga Fujii, Junji Hayakawa

Research output: Contribution to journalArticle

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Abstract

The chemical state and coordination state of copper ions have been studied in 2 MeV, 1 × 1017 Cu+ ions/cm2-implanted silica glass by X-ray absorption fine structure spectroscopy. It was found that the implanted Cu atoms are mainly present as Cu(I) state in the glass from the comparison of X-ray absorption near edge structure spectrum of the glass with those of CuO, Cu2O, CuAlO2, CuFeO2, Ca2CuO3 and MgCu2O3 crystals. We inferred from the extended X-ray absorption fine structure spectra that the implanted Cu atoms are coordinated by two oxygen atoms and the Cu-O interatomic distance is 0.188 nm in the glass.

Original languageEnglish
Pages (from-to)143-151
Number of pages9
JournalJournal of Non-Crystalline Solids
Volume238
Issue number1-2
DOIs
Publication statusPublished - Sep 1 1998

Fingerprint

X ray absorption fine structure spectroscopy
silica glass
Fused silica
Copper
X ray absorption
Ions
Glass
copper
Atoms
glass
fine structure
spectroscopy
ions
x rays
atoms
oxygen atoms
Oxygen
Crystals
crystals

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

Cite this

Fukumi, K., Chayahara, A., Kadono, K., Kageyama, H., Akai, T., Kitamura, N., ... Hayakawa, J. (1998). Structural investigation on implanted copper ions in silica glass by XAFS spectroscopy. Journal of Non-Crystalline Solids, 238(1-2), 143-151. https://doi.org/10.1016/S0022-3093(98)00576-6

Structural investigation on implanted copper ions in silica glass by XAFS spectroscopy. / Fukumi, Kohei; Chayahara, Akiyoshi; Kadono, Kohei; Kageyama, Hiroyuki; Akai, Tomoko; Kitamura, Naoyuki; Makihara, Masaki; Fujii, Kanenaga; Hayakawa, Junji.

In: Journal of Non-Crystalline Solids, Vol. 238, No. 1-2, 01.09.1998, p. 143-151.

Research output: Contribution to journalArticle

Fukumi, K, Chayahara, A, Kadono, K, Kageyama, H, Akai, T, Kitamura, N, Makihara, M, Fujii, K & Hayakawa, J 1998, 'Structural investigation on implanted copper ions in silica glass by XAFS spectroscopy', Journal of Non-Crystalline Solids, vol. 238, no. 1-2, pp. 143-151. https://doi.org/10.1016/S0022-3093(98)00576-6
Fukumi, Kohei ; Chayahara, Akiyoshi ; Kadono, Kohei ; Kageyama, Hiroyuki ; Akai, Tomoko ; Kitamura, Naoyuki ; Makihara, Masaki ; Fujii, Kanenaga ; Hayakawa, Junji. / Structural investigation on implanted copper ions in silica glass by XAFS spectroscopy. In: Journal of Non-Crystalline Solids. 1998 ; Vol. 238, No. 1-2. pp. 143-151.
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