Structural investigation on implanted copper ions in silica glass by XAFS spectroscopy

Kohei Fukumi, Akiyoshi Chayahara, Kohei Kadono, Hiroyuki Kageyama, Tomoko Akai, Naoyuki Kitamura, Masaki Makihara, Kanenaga Fujii, Junji Hayakawa

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16 Citations (Scopus)

Abstract

The chemical state and coordination state of copper ions have been studied in 2 MeV, 1 × 1017 Cu+ ions/cm2-implanted silica glass by X-ray absorption fine structure spectroscopy. It was found that the implanted Cu atoms are mainly present as Cu(I) state in the glass from the comparison of X-ray absorption near edge structure spectrum of the glass with those of CuO, Cu2O, CuAlO2, CuFeO2, Ca2CuO3 and MgCu2O3 crystals. We inferred from the extended X-ray absorption fine structure spectra that the implanted Cu atoms are coordinated by two oxygen atoms and the Cu-O interatomic distance is 0.188 nm in the glass.

Original languageEnglish
Pages (from-to)143-151
Number of pages9
JournalJournal of Non-Crystalline Solids
Volume238
Issue number1-2
DOIs
Publication statusPublished - Sep 1 1998

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

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    Fukumi, K., Chayahara, A., Kadono, K., Kageyama, H., Akai, T., Kitamura, N., Makihara, M., Fujii, K., & Hayakawa, J. (1998). Structural investigation on implanted copper ions in silica glass by XAFS spectroscopy. Journal of Non-Crystalline Solids, 238(1-2), 143-151. https://doi.org/10.1016/S0022-3093(98)00576-6