Study for surface analysis on thin film by chemical force microscope

Shieeki Nakahara, Tomoyuki Koga, Atsushi Takahara

Research output: Contribution to conferencePaperpeer-review

Abstract

Distribution of surface functional groups were analyzed with a scanning force microscope with chemically modified cantilever tip. The relative difference of lateral force between two components monolayers strongly depended on the combination of terminal functional groups at the cantilever and sample surfaces due to chemical interaction between chemically modified cantilever tip and substrate surface.

Original languageEnglish
Pages1123
Number of pages1
Publication statusPublished - 2006
Event55th SPSJ Annual Meeting - Nagoya, Japan
Duration: May 24 2006May 26 2006

Other

Other55th SPSJ Annual Meeting
Country/TerritoryJapan
CityNagoya
Period5/24/065/26/06

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Fingerprint

Dive into the research topics of 'Study for surface analysis on thin film by chemical force microscope'. Together they form a unique fingerprint.

Cite this