Study for surface analysis on thin film by chemical force microscope

Shieeki Nakahara, Tomoyuki Koga, Atsushi Takahara

Research output: Contribution to conferencePaper

Abstract

Distribution of surface functional groups were analyzed with a scanning force microscope with chemically modified cantilever tip. The relative difference of lateral force between two components monolayers strongly depended on the combination of terminal functional groups at the cantilever and sample surfaces due to chemical interaction between chemically modified cantilever tip and substrate surface.

Original languageEnglish
Number of pages1
Publication statusPublished - Oct 18 2006
Event55th SPSJ Annual Meeting - Nagoya, Japan
Duration: May 24 2006May 26 2006

Other

Other55th SPSJ Annual Meeting
CountryJapan
CityNagoya
Period5/24/065/26/06

Fingerprint

Surface analysis
Microscopes
Thin films
Functional groups
Monolayers
Scanning
Substrates

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Nakahara, S., Koga, T., & Takahara, A. (2006). Study for surface analysis on thin film by chemical force microscope. Paper presented at 55th SPSJ Annual Meeting, Nagoya, Japan.

Study for surface analysis on thin film by chemical force microscope. / Nakahara, Shieeki; Koga, Tomoyuki; Takahara, Atsushi.

2006. Paper presented at 55th SPSJ Annual Meeting, Nagoya, Japan.

Research output: Contribution to conferencePaper

Nakahara, S, Koga, T & Takahara, A 2006, 'Study for surface analysis on thin film by chemical force microscope' Paper presented at 55th SPSJ Annual Meeting, Nagoya, Japan, 5/24/06 - 5/26/06, .
Nakahara S, Koga T, Takahara A. Study for surface analysis on thin film by chemical force microscope. 2006. Paper presented at 55th SPSJ Annual Meeting, Nagoya, Japan.
Nakahara, Shieeki ; Koga, Tomoyuki ; Takahara, Atsushi. / Study for surface analysis on thin film by chemical force microscope. Paper presented at 55th SPSJ Annual Meeting, Nagoya, Japan.1 p.
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