TY - GEN
T1 - Study on a novel CMP/P-CVM fusion processing system (Type B) and its basic characteristics
AU - Oyama, Koki
AU - Sano, Yasuhisa
AU - Aida, Hideo
AU - Kim, Seongwoo
AU - Nishizawa, Hideakli
AU - Doi, Toshiro K.
AU - Kurokawa, Syuhei
AU - Miyashita, Tadakazu
AU - Yamazaki, Tsutomu
PY - 2015/1/20
Y1 - 2015/1/20
N2 - In this study, we are aiming to establish a high-efficiency, high-quality polishing process of the hard-to-process materials. Recently high-grade semiconductor substrates are made by various processing methods. CMP (Chemical Mechanical Polishing) is a main processing method to planarize a substrate. On the other hand, P-CVM is a superior processing method which does not damage the substrate surface. To achieve high-efficiency, high-quality processing, we designed an innovative fusion CMP/P-CVM processing machine and produced it experimentally. Through investigation of a fundamental property of the CMP/P-CVM fusion processing machine, we confirmed increase in removal rate and reduction of the surface roughness by the synergistic effects.
AB - In this study, we are aiming to establish a high-efficiency, high-quality polishing process of the hard-to-process materials. Recently high-grade semiconductor substrates are made by various processing methods. CMP (Chemical Mechanical Polishing) is a main processing method to planarize a substrate. On the other hand, P-CVM is a superior processing method which does not damage the substrate surface. To achieve high-efficiency, high-quality processing, we designed an innovative fusion CMP/P-CVM processing machine and produced it experimentally. Through investigation of a fundamental property of the CMP/P-CVM fusion processing machine, we confirmed increase in removal rate and reduction of the surface roughness by the synergistic effects.
UR - http://www.scopus.com/inward/record.url?scp=84925357579&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84925357579&partnerID=8YFLogxK
U2 - 10.1109/ICPT.2014.7017266
DO - 10.1109/ICPT.2014.7017266
M3 - Conference contribution
T3 - ICPT 2014 - Proceedings of International Conference on Planarization/CMP Technology 2014
SP - 142
EP - 146
BT - ICPT 2014 - Proceedings of International Conference on Planarization/CMP Technology 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th International Conference on Planarization/CMP Technology, ICPT 2014
Y2 - 19 November 2014 through 21 November 2014
ER -