Study on critical current distribution in CT-OP Bi-2223 tape based on the scanning Hall probe magnetic microscopy

Y. Honda, K. Higashikawa, M. Inoue, T. Kiss, N. Ayai, M. Kikuchi, K. Hayashi, K. Sato

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Critical current (Ic) of a Bi-2223 tape fabricated by controlled-overpressure (CT-OP) sintering method has been attained up to 200 A-class in recent years. However, current limiting factors have not been fully clarified yet. In this study, we have investigated local current distributions in a CT-OP Bi-2223 tape by using the scanning Hall probe magnetic microscopy. As a result, it has been found that large sheet current flows in the center of the sample. Even though the influence of self-field is taken into account, there is a clear difference of local Ic across the width. The maximum sheet current value in the center of the tape is 400-450 A/cm when we applied the bias current of 100 A, which is equal to the Ic at around 87 K. This value is equivalent to 800-900 A/cm at 77 K taking into account the value of Ic. Furthermore, such current distribution continues uniformly in length direction. From these results, we have concluded that improvement of current uniformity across the tape width is the effective way to enhance critical current for the present CT-OP Bi-2223 tape. Our results show the feasibility for 300 A-class Ic at 77 K.

Original languageEnglish
Pages (from-to)1377-1379
Number of pages3
JournalPhysica C: Superconductivity and its applications
Volume470
Issue number20
DOIs
Publication statusPublished - Nov 1 2010

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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