Study on local inhomogeneity in TFA-MOD YBCO coated conductor by use of low temperature scanning laser microscopy

M. Inoue, T. Kiss, H. Tokutomi, T. Shoyama, K. Imamura, M. Takeo, Y. Iijima, K. Kakimoto, T. Saitoh, Y. Tokunaga, T. Izumi, Y. Shiohara

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