Study on malfunction mechanism of semiconductor circuit breaker in 400V DC power supply system

Seiya Abe, Kosuke Nomura, Kentaro Fukushima, Masahito Shoyama, Tamotsu Ninomiya, Akira Matsumoto, Akiyoshi Fukui, Mikio Yamasaki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Recently, DC power supply systems have been widely viewed as an energy-saving solution. The protection of the system from over current is one of the most important factors in DC power supply system. This paper presents malfunction mechanism of a semiconductor circuit breaker.

Original languageEnglish
Title of host publication2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010
Pages2644-2649
Number of pages6
DOIs
Publication statusPublished - 2010
Event2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010 - Sapporo, Japan
Duration: Jun 21 2010Jun 24 2010

Other

Other2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010
CountryJapan
CitySapporo
Period6/21/106/24/10

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All Science Journal Classification (ASJC) codes

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this

Abe, S., Nomura, K., Fukushima, K., Shoyama, M., Ninomiya, T., Matsumoto, A., ... Yamasaki, M. (2010). Study on malfunction mechanism of semiconductor circuit breaker in 400V DC power supply system. In 2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010 (pp. 2644-2649). [5542368] https://doi.org/10.1109/IPEC.2010.5542368