Study on malfunction mechanism of semiconductor circuit breaker in 400V DC power supply system

Seiya Abe; Kosuke Nomura; Kentaro Fukushima; Masahito Shoyama; Tamotsu Ninomiya; Akira Matsumoto; Akiyoshi Fukui; Mikio Yamasaki

doi:10.1109/IPEC.2010.5542368

Study on malfunction mechanism of semiconductor circuit breaker in 400V DC power supply system

Seiya Abe, Kosuke Nomura, Kentaro Fukushima, Masahito Shoyama, Tamotsu Ninomiya, Akira Matsumoto, Akiyoshi Fukui, Mikio Yamasaki

Applied Energy Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Citations (Scopus)

Abstract

Recently, DC power supply systems have been widely viewed as an energy-saving solution. The protection of the system from over current is one of the most important factors in DC power supply system. This paper presents malfunction mechanism of a semiconductor circuit breaker.

Original language	English
Title of host publication	2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010
Pages	2644-2649
Number of pages	6
DOIs	https://doi.org/10.1109/IPEC.2010.5542368
Publication status	Published - 2010
Event	2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010 - Sapporo, Japan Duration: Jun 21 2010 → Jun 24 2010

Other

Other	2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010
Country/Territory	Japan
City	Sapporo
Period	6/21/10 → 6/24/10

All Science Journal Classification (ASJC) codes

Energy Engineering and Power Technology
Electrical and Electronic Engineering

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10.1109/IPEC.2010.5542368

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Abe, S, Nomura, K, Fukushima, K, Shoyama, M, Ninomiya, T, Matsumoto, A, Fukui, A & Yamasaki, M 2010, Study on malfunction mechanism of semiconductor circuit breaker in 400V DC power supply system. in 2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010., 5542368, pp. 2644-2649, 2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010, Sapporo, Japan, 6/21/10. https://doi.org/10.1109/IPEC.2010.5542368

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abstract = "Recently, DC power supply systems have been widely viewed as an energy-saving solution. The protection of the system from over current is one of the most important factors in DC power supply system. This paper presents malfunction mechanism of a semiconductor circuit breaker.",

author = "Seiya Abe and Kosuke Nomura and Kentaro Fukushima and Masahito Shoyama and Tamotsu Ninomiya and Akira Matsumoto and Akiyoshi Fukui and Mikio Yamasaki",

year = "2010",

doi = "10.1109/IPEC.2010.5542368",

language = "English",

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T1 - Study on malfunction mechanism of semiconductor circuit breaker in 400V DC power supply system

AU - Abe, Seiya

AU - Nomura, Kosuke

AU - Fukushima, Kentaro

AU - Shoyama, Masahito

AU - Ninomiya, Tamotsu

AU - Matsumoto, Akira

AU - Fukui, Akiyoshi

AU - Yamasaki, Mikio

PY - 2010

Y1 - 2010

N2 - Recently, DC power supply systems have been widely viewed as an energy-saving solution. The protection of the system from over current is one of the most important factors in DC power supply system. This paper presents malfunction mechanism of a semiconductor circuit breaker.

AB - Recently, DC power supply systems have been widely viewed as an energy-saving solution. The protection of the system from over current is one of the most important factors in DC power supply system. This paper presents malfunction mechanism of a semiconductor circuit breaker.

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U2 - 10.1109/IPEC.2010.5542368

DO - 10.1109/IPEC.2010.5542368

M3 - Conference contribution

AN - SCOPUS:77956505660

SN - 9781424453955

SP - 2644

EP - 2649

BT - 2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010

T2 - 2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010

Y2 - 21 June 2010 through 24 June 2010

ER -

Study on malfunction mechanism of semiconductor circuit breaker in 400V DC power supply system

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