TY - GEN
T1 - Sub-wavelength micromachining of silica glass by irradiation of infrared laser with Fresnel diffraction
AU - Okazaki, K.
AU - Nakamura, D.
AU - Okada, T.
AU - Niino, H.
AU - Torii, S.
AU - Makimura, T.
AU - Murakami, K.
AU - Takahashi, A.
PY - 2010/12/1
Y1 - 2010/12/1
N2 - We investigated a simple and productive micromachining method of silica glass by the ablation using a 10.6 μm TEA CO2 laser with a spatial resolution down to sub-wavelength scale. Copper grid mask with square apertures of 20×20 μm was attached to the silica glass surface, and the silica glass was irradiated by the TEA CO2 laser light through the mask. As a result, circular holes were formed on the silica glass surface at the center of the apertures due to the Fresnel diffraction effect, and a minimum diameter of the hole was less than 3 μm. The mechanism of the micromachining was discussed based on the electric field distribution of the CO2 laser light under the mask, by a 3D full-wave electromagnetic field simulation.
AB - We investigated a simple and productive micromachining method of silica glass by the ablation using a 10.6 μm TEA CO2 laser with a spatial resolution down to sub-wavelength scale. Copper grid mask with square apertures of 20×20 μm was attached to the silica glass surface, and the silica glass was irradiated by the TEA CO2 laser light through the mask. As a result, circular holes were formed on the silica glass surface at the center of the apertures due to the Fresnel diffraction effect, and a minimum diameter of the hole was less than 3 μm. The mechanism of the micromachining was discussed based on the electric field distribution of the CO2 laser light under the mask, by a 3D full-wave electromagnetic field simulation.
UR - http://www.scopus.com/inward/record.url?scp=79951641812&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79951641812&partnerID=8YFLogxK
U2 - 10.1109/TENCON.2010.5686422
DO - 10.1109/TENCON.2010.5686422
M3 - Conference contribution
AN - SCOPUS:79951641812
SN - 9781424468904
T3 - IEEE Region 10 Annual International Conference, Proceedings/TENCON
SP - 1905
EP - 1908
BT - TENCON 2010 - 2010 IEEE Region 10 Conference
T2 - 2010 IEEE Region 10 Conference, TENCON 2010
Y2 - 21 November 2010 through 24 November 2010
ER -