The practical utilization of electronic and optoelectronic materials such as perovskites not only relies on their good device performance and moisture stability but also requires stability under other operating conditions. Herein, the operational stability of the Dion–Jacobson perovskite (DJP) photodetector under different harsh conditions is carefully studied and compared with that of its widely studied counterpart, i.e., the Ruddlesden–Popper perovskite (RPP) photodetector. The DJP-based photodetector can maintain its responsivity after storage in humid environments for two months and can ensure stable operation without any photocurrent degradation under continuous light illumination for 20 000 s. Moreover, the DJP film does not exhibit any changes in its absorbance spectrum and surface morphology when it is heated at 100 °C for 18 h, and the film is hardly affected by high-energy electron beam irradiation. In addition, the mechanical stability of the DJP film is also found to be superior based on the cyclic bending measurements of the fabricated flexible photodetectors. The excellent performance and stability of the DJP-based photodetector are found to be the result of the elimination of weak van der Waals bonds among the octahedral PbI4 layers of DJP films, which is typically observed in RPP films.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics