Surface mobile layer of polystyrene film below bulk glass transition temperature [5]

Research output: Contribution to journalLetter

56 Citations (Scopus)

Abstract

Interfacial thickness of surface mobile layer of polystyrene (PS) film below bulk glass transition temperature was studied. Uniformity of the bilayer interface, built from two surfaces of monodisperse PS (hPS) and monodisperse deuterated PS (dPS), was confirmed using atomic force microscopy. The interfacial broadening of the bilayer by annealing was examined on the basis of depth profiling by dynamic secondary ion mass spectroscopic (DSIMS) measurements. Interfacial thickness was found to monotically increase with annealing time at 393 K above bulk glass transition temperature. Results indicated constant interfacial thickness at temperatures between bulk glass transition temperature and surface glass transition temperature.

Original languageEnglish
Pages (from-to)6164-6166
Number of pages3
JournalMacromolecules
Volume34
Issue number18
DOIs
Publication statusPublished - Aug 28 2001

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Polystyrenes
Annealing
Depth profiling
Atomic force microscopy
Ions
Glass transition temperature
Temperature

All Science Journal Classification (ASJC) codes

  • Materials Chemistry

Cite this

Surface mobile layer of polystyrene film below bulk glass transition temperature [5]. / Kawaguchi, Daisuke; Tanaka, Keiji; Takahara, Atsushi; Kajiyama, Tisato.

In: Macromolecules, Vol. 34, No. 18, 28.08.2001, p. 6164-6166.

Research output: Contribution to journalLetter

@article{9745266f81ff41a3a875c121a0f5fe20,
title = "Surface mobile layer of polystyrene film below bulk glass transition temperature [5]",
abstract = "Interfacial thickness of surface mobile layer of polystyrene (PS) film below bulk glass transition temperature was studied. Uniformity of the bilayer interface, built from two surfaces of monodisperse PS (hPS) and monodisperse deuterated PS (dPS), was confirmed using atomic force microscopy. The interfacial broadening of the bilayer by annealing was examined on the basis of depth profiling by dynamic secondary ion mass spectroscopic (DSIMS) measurements. Interfacial thickness was found to monotically increase with annealing time at 393 K above bulk glass transition temperature. Results indicated constant interfacial thickness at temperatures between bulk glass transition temperature and surface glass transition temperature.",
author = "Daisuke Kawaguchi and Keiji Tanaka and Atsushi Takahara and Tisato Kajiyama",
year = "2001",
month = "8",
day = "28",
doi = "10.1021/ma010012k",
language = "English",
volume = "34",
pages = "6164--6166",
journal = "Macromolecules",
issn = "0024-9297",
publisher = "American Chemical Society",
number = "18",

}

TY - JOUR

T1 - Surface mobile layer of polystyrene film below bulk glass transition temperature [5]

AU - Kawaguchi, Daisuke

AU - Tanaka, Keiji

AU - Takahara, Atsushi

AU - Kajiyama, Tisato

PY - 2001/8/28

Y1 - 2001/8/28

N2 - Interfacial thickness of surface mobile layer of polystyrene (PS) film below bulk glass transition temperature was studied. Uniformity of the bilayer interface, built from two surfaces of monodisperse PS (hPS) and monodisperse deuterated PS (dPS), was confirmed using atomic force microscopy. The interfacial broadening of the bilayer by annealing was examined on the basis of depth profiling by dynamic secondary ion mass spectroscopic (DSIMS) measurements. Interfacial thickness was found to monotically increase with annealing time at 393 K above bulk glass transition temperature. Results indicated constant interfacial thickness at temperatures between bulk glass transition temperature and surface glass transition temperature.

AB - Interfacial thickness of surface mobile layer of polystyrene (PS) film below bulk glass transition temperature was studied. Uniformity of the bilayer interface, built from two surfaces of monodisperse PS (hPS) and monodisperse deuterated PS (dPS), was confirmed using atomic force microscopy. The interfacial broadening of the bilayer by annealing was examined on the basis of depth profiling by dynamic secondary ion mass spectroscopic (DSIMS) measurements. Interfacial thickness was found to monotically increase with annealing time at 393 K above bulk glass transition temperature. Results indicated constant interfacial thickness at temperatures between bulk glass transition temperature and surface glass transition temperature.

UR - http://www.scopus.com/inward/record.url?scp=0035964512&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035964512&partnerID=8YFLogxK

U2 - 10.1021/ma010012k

DO - 10.1021/ma010012k

M3 - Letter

VL - 34

SP - 6164

EP - 6166

JO - Macromolecules

JF - Macromolecules

SN - 0024-9297

IS - 18

ER -