Surface resistance measurement of superconducting thin film using probe-coupling-type microstrip line resonator

Daisuke Okai, Masanobu Kusunoki, Masashi Mukaida, Shigetoshi Ohshima

Research output: Contribution to journalArticlepeer-review

Abstract

To design superconducting microwave receivers, the surface resistance of the superconducting thin film must be considered. Therefore, a highly accurate technique for measuring the surface resistance of superconducting thin films should be established. In this paper, we propose a probe-coupled microstrip line resonator as a technique for measuring the surface resistance of superconducting thin films. In the resonator technique, the surface resistance is calculated from Qu, the unloaded Q, of the resonator. Since the microstrip line resonator searches for an accurate surface resistance of the superconducting thin film, establishing a technique that accurately determines the Qu of the resonator is crucial. We measure the Qu values of resonators fabricated from metal and superconducting thin film by a probe-coupled microstrip line resonator and describe the accuracy of Qu measurement by the probe-coupled micro-strip line resonator and the repeatability of the surface resistance measurement of a superconducting thin film.

Original languageEnglish
Pages (from-to)27-35
Number of pages9
JournalElectronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
Volume86
Issue number4
DOIs
Publication statusPublished - Apr 2003
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)
  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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