Surface resistance of RE123 films with artificial pinning centers

M. Mukaida; A. Saito; R. Kita; K. Matsumoto; A. Ichinose; Y. Yoshida; S. Horii; K. Yamada; N. Mori

doi:10.1016/j.physc.2006.05.074

Surface resistance of RE123 films with artificial pinning centers

M. Mukaida, A. Saito, R. Kita, K. Matsumoto, A. Ichinose, Y. Yoshida, S. Horii, K. Yamada, N. Mori

Advanced Materials Physics

Research output: Contribution to journal › Article

Abstract

Effects of artificial pinning centers (APCs) into ErBa₂Cu₃O_7-δ films are discussed. The APCs used in this paper is BaZrO₃ and Zn which are mixed into ErBa₂Cu₃O_7-δ ceramic targets. The targets with various contents of APCs are ablated and films are grown on substrates with the APCs. X-ray diffraction patterns show there are no other phases than ErBa₂Cu₃O_7-δ and APCs. Transmission electron microscopy (TEM) shows the BaZrO₃ APSs grow along the c-axis of the films. The introduction of APCs decreases surface resistance (R_S) of ErBa₂Cu₃O_7-δ films and increases critical current density (J_C) of the films. R_S measurements revealed that the ErBa₂Cu₃O_7-δ films with APCs showed a lower R_S than that of the ErBa₂Cu₃O_7-δ films without APCs.

Original language	English
Pages (from-to)	828-832
Number of pages	5
Journal	Physica C: Superconductivity and its applications
Volume	445-448
Issue number	1-2
DOIs	https://doi.org/10.1016/j.physc.2006.05.074
Publication status	Published - Oct 1 2006

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All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

Cite this

Mukaida, M., Saito, A., Kita, R., Matsumoto, K., Ichinose, A., Yoshida, Y., ... Mori, N. (2006). Surface resistance of RE123 films with artificial pinning centers. Physica C: Superconductivity and its applications, 445-448(1-2), 828-832. https://doi.org/10.1016/j.physc.2006.05.074

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title = "Surface resistance of RE123 films with artificial pinning centers",

abstract = "Effects of artificial pinning centers (APCs) into ErBa2Cu3O7-δ films are discussed. The APCs used in this paper is BaZrO3 and Zn which are mixed into ErBa2Cu3O7-δ ceramic targets. The targets with various contents of APCs are ablated and films are grown on substrates with the APCs. X-ray diffraction patterns show there are no other phases than ErBa2Cu3O7-δ and APCs. Transmission electron microscopy (TEM) shows the BaZrO3 APSs grow along the c-axis of the films. The introduction of APCs decreases surface resistance (RS) of ErBa2Cu3O7-δ films and increases critical current density (JC) of the films. RS measurements revealed that the ErBa2Cu3O7-δ films with APCs showed a lower RS than that of the ErBa2Cu3O7-δ films without APCs.",

author = "M. Mukaida and A. Saito and R. Kita and K. Matsumoto and A. Ichinose and Y. Yoshida and S. Horii and K. Yamada and N. Mori",

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AU - Mukaida, M.

AU - Saito, A.

AU - Kita, R.

AU - Matsumoto, K.

AU - Ichinose, A.

AU - Yoshida, Y.

AU - Horii, S.

AU - Yamada, K.

AU - Mori, N.

PY - 2006/10/1

Y1 - 2006/10/1

N2 - Effects of artificial pinning centers (APCs) into ErBa2Cu3O7-δ films are discussed. The APCs used in this paper is BaZrO3 and Zn which are mixed into ErBa2Cu3O7-δ ceramic targets. The targets with various contents of APCs are ablated and films are grown on substrates with the APCs. X-ray diffraction patterns show there are no other phases than ErBa2Cu3O7-δ and APCs. Transmission electron microscopy (TEM) shows the BaZrO3 APSs grow along the c-axis of the films. The introduction of APCs decreases surface resistance (RS) of ErBa2Cu3O7-δ films and increases critical current density (JC) of the films. RS measurements revealed that the ErBa2Cu3O7-δ films with APCs showed a lower RS than that of the ErBa2Cu3O7-δ films without APCs.

AB - Effects of artificial pinning centers (APCs) into ErBa2Cu3O7-δ films are discussed. The APCs used in this paper is BaZrO3 and Zn which are mixed into ErBa2Cu3O7-δ ceramic targets. The targets with various contents of APCs are ablated and films are grown on substrates with the APCs. X-ray diffraction patterns show there are no other phases than ErBa2Cu3O7-δ and APCs. Transmission electron microscopy (TEM) shows the BaZrO3 APSs grow along the c-axis of the films. The introduction of APCs decreases surface resistance (RS) of ErBa2Cu3O7-δ films and increases critical current density (JC) of the films. RS measurements revealed that the ErBa2Cu3O7-δ films with APCs showed a lower RS than that of the ErBa2Cu3O7-δ films without APCs.

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10.1016/j.physc.2006.05.074