Surface roughness induced electron mobility degradation in InAs nanowires

Fengyun Wang, Senpo Yip, Ning Han, Kitwa Fok, Hao Lin, Jared J. Hou, Guofa Dong, Takfu Hung, K. S. Chan, Johnny C. Ho

Research output: Contribution to journalArticlepeer-review

43 Citations (Scopus)

Abstract

In this work, we present a study of the surface roughness dependent electron mobility in InAs nanowires grown by the nickel-catalyzed chemical vapor deposition method. These nanowires have good crystallinity, well-controlled surface morphology without any surface coating or tapering and an excellent peak field-effect mobility up to 15 000 cm2 V-1 s-1 when configured into back-gated field-effect nanowire transistors. Detailed electrical characterizations reveal that the electron mobility degrades monotonically with increasing surface roughness and diameter scaling, while low-temperature measurements further decouple the effects of surface/interface traps and phonon scattering, highlighting the dominant impact of surface roughness scattering on the electron mobility for miniaturized and surface disordered nanowires. All these factors suggest that careful consideration of nanowire geometries and surface condition is required for designing devices with optimal performance.

Original languageEnglish
Article number375202
JournalNanotechnology
Volume24
Issue number37
DOIs
Publication statusPublished - Sep 20 2013
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Surface roughness induced electron mobility degradation in InAs nanowires'. Together they form a unique fingerprint.

Cite this