Surface roughness induced electron mobility degradation in InAs nanowires

Fengyun Wang, Senpo Yip, Ning Han, Kitwa Fok, Hao Lin, Jared J. Hou, Guofa Dong, Takfu Hung, K. S. Chan, Johnny C. Ho

Research output: Contribution to journalArticlepeer-review

43 Citations (Scopus)

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Chemical Compounds

Engineering & Materials Science