TY - JOUR
T1 - Tadf oled emission zone and stability analysis with water exposure to different layers during deposition
AU - Ciarnáin, Rossa Mac
AU - Mo, Hin Wai
AU - Nagayoshi, Kaori
AU - Fujimoto, Hiroshi
AU - Harada, Kentaro
AU - Ke, Tung Huei
AU - Heremans, Paul
AU - Adachi, Chihaya
N1 - Funding Information:
We appreciate the support of the Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan through the Program for Building Regional Innovation Ecosystems administered by Prof. R. Hayashi of Shibuara Institute of Technology, Tokyo.
Publisher Copyright:
© 2021 SID.
PY - 2021
Y1 - 2021
N2 - Reliable devices are essential for the commercialization of OLED technology. OLED materials are notorious for their sensitivity to various substances such as water. For thermally activated delayed emission (TADF) OLEDs, which layers are most water-sensitive is unknown. Work towards understanding how water affects OLED performance is shown. Surprisingly, it is shown that the water effect on the emission layer is negligible compared to other layers in this stack. The emission zone is measured for fresh and degraded OLEDs deposited under different water partial pressures. Using a novel highly sensitive measurement method, a shift to the anode side was observed.
AB - Reliable devices are essential for the commercialization of OLED technology. OLED materials are notorious for their sensitivity to various substances such as water. For thermally activated delayed emission (TADF) OLEDs, which layers are most water-sensitive is unknown. Work towards understanding how water affects OLED performance is shown. Surprisingly, it is shown that the water effect on the emission layer is negligible compared to other layers in this stack. The emission zone is measured for fresh and degraded OLEDs deposited under different water partial pressures. Using a novel highly sensitive measurement method, a shift to the anode side was observed.
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U2 - 10.1002/sdtp.14989
DO - 10.1002/sdtp.14989
M3 - Conference article
AN - SCOPUS:85113865123
VL - 52
SP - 1477
EP - 1481
JO - Digest of Technical Papers - SID International Symposium
JF - Digest of Technical Papers - SID International Symposium
SN - 0097-966X
IS - 1
T2 - 58th International Symposium on Digest of Technical Papers, ICDT 2021
Y2 - 17 May 2021 through 21 May 2021
ER -