Tangential image of helical SXR emissivity structure in low-aspect-ratio RFP

Akio Sanpei, Kensuke Oki, Mitsuru Nakamura, Akio Higashi, Hidehiko Motoi, Daisuke Fukahori, Haruhiko Himura, Sadao Masamune, Satoshi Ohdachi, Nobuhiro Nishino, Takumi Onchi, Ryuya Ikezoe

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2 Citations (Scopus)

Abstract

A hot helical structure in low-aspect-ratio (A) reversed field pinch (RFP) is obtained with the soft X-ray (SXR) imaging technique. Tangential SXR imaging camera and high-speed camera system is applied to low-A RFP for studying quasi-single-helicity RFP state. The helical structure correlated with m = 1/n = 4 tearing mode is identified by means of a subtraction technique.

Original languageEnglish
Article number5960796
Pages (from-to)2410-2411
Number of pages2
JournalIEEE Transactions on Plasma Science
Volume39
Issue number11 PART 1
DOIs
Publication statusPublished - Nov 1 2011
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Condensed Matter Physics

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    Sanpei, A., Oki, K., Nakamura, M., Higashi, A., Motoi, H., Fukahori, D., Himura, H., Masamune, S., Ohdachi, S., Nishino, N., Onchi, T., & Ikezoe, R. (2011). Tangential image of helical SXR emissivity structure in low-aspect-ratio RFP. IEEE Transactions on Plasma Science, 39(11 PART 1), 2410-2411. [5960796]. https://doi.org/10.1109/TPS.2011.2160369