Abstract
<p>We have developed a unique methodology and a new hardware/software-integrated system for in-situ straining and electron tomography (ET) experiments. The central software of the system controls a straining-and-tomography specimen holder, imaging devices and the specimen stage of a transmission electron microscope (TEM) in an integrated manner. Using the system, one can perform in-situ time-resolved three-dimensional (3D) studies that explore in real-time and at sub-microscopic levels the internal behavior of materials subjected to external stresses. 3D visualization of a Pb–Sn solder alloy thin foil's deformation dynamics by iterative step-wise stress loading and tilt-series data sets acquisition is introduced as an application of the system.</p>
| Translated title of the contribution | Development of An <i>In-Situ</i> Straining and Tomography System in TEM |
|---|---|
| Original language | Japanese |
| Pages (from-to) | 44-48 |
| Number of pages | 5 |
| Journal | Kenbikyo |
| Volume | 54 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2019 |