Temperature mapping on a suspended carbon nanotube using electron thermal microscopy

Koji Takahashi, Kazuma Nomoto, Tatsuya Ikuta

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Nanoscale thermal mapping along an individual multi-walled carbon nanotube suspended between two electrodes/heat-sinks was successfully demonstrated by using the solid/liquid phase transition of indium nanoparticles in a transmission electron microscope. The brightness shift of nanoparticles in the dark-field image was clearly recognized according to the DC heating of the nanotube. It was also found that the indium deposition induces defects in the nanotube, resulting in the decrease of thermal conductivity. The temperature distribution along the nanotube obtained from the dark-field images showed good agreement with the simulated data of a defective nanotube with Joule-heating.

Original languageEnglish
Title of host publicationIEEE-NANO 2015 - 15th International Conference on Nanotechnology
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages781-784
Number of pages4
ISBN (Electronic)9781467381550
DOIs
Publication statusPublished - Jan 1 2015
Event15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 - Rome, Italy
Duration: Jul 27 2015Jul 30 2015

Publication series

NameIEEE-NANO 2015 - 15th International Conference on Nanotechnology

Other

Other15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015
CountryItaly
CityRome
Period7/27/157/30/15

All Science Journal Classification (ASJC) codes

  • Process Chemistry and Technology
  • Electrical and Electronic Engineering
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films

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  • Cite this

    Takahashi, K., Nomoto, K., & Ikuta, T. (2015). Temperature mapping on a suspended carbon nanotube using electron thermal microscopy. In IEEE-NANO 2015 - 15th International Conference on Nanotechnology (pp. 781-784). [7388726] (IEEE-NANO 2015 - 15th International Conference on Nanotechnology). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NANO.2015.7388726