Test beams summary

Research output: Contribution to conferencePaper

Abstract

ILC detectors are required to have unprecedented precision. Achieving this requires significant investment for test beam activities to complete the detector R&D needed, to test prototypes and (later) to qualify final detector system designs, including integrated system test. This document summarizes the discussion at this workshop on the test beam facilities and detector R&D programs to be performed there.

Original languageEnglish
Publication statusPublished - Dec 1 2010
Externally publishedYes
Event2010 Linear Collider Workshop, LCWS 2010 and International Linear Collider Meeting, ILC 2010 - Beijing, China
Duration: Mar 26 2010Mar 30 2010

Other

Other2010 Linear Collider Workshop, LCWS 2010 and International Linear Collider Meeting, ILC 2010
CountryChina
CityBeijing
Period3/26/103/30/10

Fingerprint

detectors
systems engineering
prototypes

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics

Cite this

Kawagoe, K. (2010). Test beams summary. Paper presented at 2010 Linear Collider Workshop, LCWS 2010 and International Linear Collider Meeting, ILC 2010, Beijing, China.

Test beams summary. / Kawagoe, Kiyotomo.

2010. Paper presented at 2010 Linear Collider Workshop, LCWS 2010 and International Linear Collider Meeting, ILC 2010, Beijing, China.

Research output: Contribution to conferencePaper

Kawagoe, K 2010, 'Test beams summary', Paper presented at 2010 Linear Collider Workshop, LCWS 2010 and International Linear Collider Meeting, ILC 2010, Beijing, China, 3/26/10 - 3/30/10.
Kawagoe K. Test beams summary. 2010. Paper presented at 2010 Linear Collider Workshop, LCWS 2010 and International Linear Collider Meeting, ILC 2010, Beijing, China.
Kawagoe, Kiyotomo. / Test beams summary. Paper presented at 2010 Linear Collider Workshop, LCWS 2010 and International Linear Collider Meeting, ILC 2010, Beijing, China.
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