The application of ion beam analysis to mass transport studies in mixed electronic ionic conducting electrodes

J. A. Kilner, H. Tellez Lozano, M. Burriel, S. Cook, John William Richard Druce

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The measurement of the mass transport and oxygen exchange in materials for SOFCs has been greatly aided by the use of ion beam analysis techniques. In particular this has focused on the use of Secondary Ion Mass Spectrometry (SIMS) to measure diffusion profiles of oxygen 18 in ceramics to determine the kinetics of the bulk transport of oxygen. A second ion beam technique, Low Energy Ion Scattering (LEIS) can provide important information about the composition of the outermost atomic layers of the same materials where the gas/solid oxygen exchange process is taking place. The application of the newer technique of LEIS to materials for air electrodes is discussed and the behaviour of some common perovskite materials is explored.

Original languageEnglish
Pages (from-to)1701-1708
Number of pages8
JournalECS Transactions
Volume57
Issue number1
DOIs
Publication statusPublished - Jan 1 2013

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Ion beams
Mass transfer
Electrodes
Oxygen
Scattering
Ions
Secondary ion mass spectrometry
Solid oxide fuel cells (SOFC)
Perovskite
Kinetics
Air
Chemical analysis
Gases

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

The application of ion beam analysis to mass transport studies in mixed electronic ionic conducting electrodes. / Kilner, J. A.; Tellez Lozano, H.; Burriel, M.; Cook, S.; Druce, John William Richard.

In: ECS Transactions, Vol. 57, No. 1, 01.01.2013, p. 1701-1708.

Research output: Contribution to journalArticle

Kilner, J. A. ; Tellez Lozano, H. ; Burriel, M. ; Cook, S. ; Druce, John William Richard. / The application of ion beam analysis to mass transport studies in mixed electronic ionic conducting electrodes. In: ECS Transactions. 2013 ; Vol. 57, No. 1. pp. 1701-1708.
@article{f3546c3b5a394e939489e246dd7b0296,
title = "The application of ion beam analysis to mass transport studies in mixed electronic ionic conducting electrodes",
abstract = "The measurement of the mass transport and oxygen exchange in materials for SOFCs has been greatly aided by the use of ion beam analysis techniques. In particular this has focused on the use of Secondary Ion Mass Spectrometry (SIMS) to measure diffusion profiles of oxygen 18 in ceramics to determine the kinetics of the bulk transport of oxygen. A second ion beam technique, Low Energy Ion Scattering (LEIS) can provide important information about the composition of the outermost atomic layers of the same materials where the gas/solid oxygen exchange process is taking place. The application of the newer technique of LEIS to materials for air electrodes is discussed and the behaviour of some common perovskite materials is explored.",
author = "Kilner, {J. A.} and {Tellez Lozano}, H. and M. Burriel and S. Cook and Druce, {John William Richard}",
year = "2013",
month = "1",
day = "1",
doi = "10.1149/05701.1701ecst",
language = "English",
volume = "57",
pages = "1701--1708",
journal = "ECS Transactions",
issn = "1938-5862",
publisher = "Electrochemical Society, Inc.",
number = "1",

}

TY - JOUR

T1 - The application of ion beam analysis to mass transport studies in mixed electronic ionic conducting electrodes

AU - Kilner, J. A.

AU - Tellez Lozano, H.

AU - Burriel, M.

AU - Cook, S.

AU - Druce, John William Richard

PY - 2013/1/1

Y1 - 2013/1/1

N2 - The measurement of the mass transport and oxygen exchange in materials for SOFCs has been greatly aided by the use of ion beam analysis techniques. In particular this has focused on the use of Secondary Ion Mass Spectrometry (SIMS) to measure diffusion profiles of oxygen 18 in ceramics to determine the kinetics of the bulk transport of oxygen. A second ion beam technique, Low Energy Ion Scattering (LEIS) can provide important information about the composition of the outermost atomic layers of the same materials where the gas/solid oxygen exchange process is taking place. The application of the newer technique of LEIS to materials for air electrodes is discussed and the behaviour of some common perovskite materials is explored.

AB - The measurement of the mass transport and oxygen exchange in materials for SOFCs has been greatly aided by the use of ion beam analysis techniques. In particular this has focused on the use of Secondary Ion Mass Spectrometry (SIMS) to measure diffusion profiles of oxygen 18 in ceramics to determine the kinetics of the bulk transport of oxygen. A second ion beam technique, Low Energy Ion Scattering (LEIS) can provide important information about the composition of the outermost atomic layers of the same materials where the gas/solid oxygen exchange process is taking place. The application of the newer technique of LEIS to materials for air electrodes is discussed and the behaviour of some common perovskite materials is explored.

UR - http://www.scopus.com/inward/record.url?scp=84903952868&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84903952868&partnerID=8YFLogxK

U2 - 10.1149/05701.1701ecst

DO - 10.1149/05701.1701ecst

M3 - Article

AN - SCOPUS:84903952868

VL - 57

SP - 1701

EP - 1708

JO - ECS Transactions

JF - ECS Transactions

SN - 1938-5862

IS - 1

ER -