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The characteristics of multilayer thin films deposited with metal thin films (Ag, Al, Cu)
Dong Hun Kim, Ri Ichi Murakami, Yun Hae Kim, Kyung Man Moon, Seung Jun An, Tae Hyun Kim, Pang Pang Wang
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
5
Citations
(Scopus)