We have examined the correlation between the critical current density (J c ) and the surface resistance (R(s)) of an YBa 2 Cu 3 O 7-δ (YBCO) thin film. YBCO films were prepared in an inductively coupled plasma sputtering system on MgO and BSO/MgO substrates. BaSnO 3 (BSO) was used as a buffer material for the MgO substrates. J c was determined by magnetic measurements, and R s was measured using a sapphire rod resonator method. The correlation of critical current and surface resistance has been reported previously, however, there is few researches in which a systematic correlation of R s and J c using the same sample has been done. To begin with, we measured R s by the dielectric resonator method, and next, J c was measured using the magnetic field method. As a result, it was proven that there was a strong correlation between R s and J c . We found that the relationship between J c and R s (at 22 GHz) could be expressed by the following equation, R s = 2.0 × 10 7 J c -1 , where the unit of R(s) is the ohm, and the unit of J c is A/m 2 . It was found that the relation was applicable in a wide temperature range under T c . The value of the surface resistance can be estimated, if an accurate critical current is obtained.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering