The correlation of the critical current density and surface resistance of YBa2Cu3O7-δ thin films

S. Ohshima, S. Oikawa, T. Noguchi, M. Inadomaru, M. Kusunoki, M. Mukaida, H. Yamasaki, Y. Nakagawa

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30 Citations (Scopus)

Abstract

We have examined the correlation between the critical current density (Jc) and the surface resistance (R(s)) of an YBa2Cu3O7-δ (YBCO) thin film. YBCO films were prepared in an inductively coupled plasma sputtering system on MgO and BSO/MgO substrates. BaSnO3 (BSO) was used as a buffer material for the MgO substrates. Jc was determined by magnetic measurements, and Rs was measured using a sapphire rod resonator method. The correlation of critical current and surface resistance has been reported previously, however, there is few researches in which a systematic correlation of Rs and Jc using the same sample has been done. To begin with, we measured Rs by the dielectric resonator method, and next, Jc was measured using the magnetic field method. As a result, it was proven that there was a strong correlation between Rs and Jc. We found that the relationship between Jc and Rs (at 22 GHz) could be expressed by the following equation, Rs = 2.0 × 107Jc-1, where the unit of R(s) is the ohm, and the unit of Jc is A/m2. It was found that the relation was applicable in a wide temperature range under Tc. The value of the surface resistance can be estimated, if an accurate critical current is obtained.

Original languageEnglish
Pages (from-to)671-674
Number of pages4
JournalPhysica C: Superconductivity and its applications
Volume372-376
Issue numberPART 2
DOIs
Publication statusPublished - Aug 2002
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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