The crystallinity and surface morphology of zinc octaethylporphyrin thin films on an indium-tin-oxide substrate

Soh Ryuzaki, J. Onoe

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The crystallinity and surface morphology of zinc octaethylporphyrin, Zn(OEP), thin films (20 nm thick) deposited on an indium-tin-oxide substrate have been investigated using x-ray diffraction (XRD) and scanning electron microscopy (SEM). XRD and SEM results show that the Zn(OEP) film formed at room temperature (RT) was amorphous and its surface morphology was smooth, whereas the film deposited at 473 K was crystalline and its surface morphology became rough compared to that formed at RT. On the other hand, when the Zn(OEP) film formed at RT was subsequently annealed at 473 K for 1 min, the film was crystallized as well as formed at 473 K but its surface morphology was maintained to be smooth.

Original languageEnglish
Article number033516
JournalJournal of Applied Physics
Volume103
Issue number3
DOIs
Publication statusPublished - Feb 22 2008
Externally publishedYes

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indium oxides
tin oxides
crystallinity
zinc
thin films
x ray diffraction
room temperature
scanning electron microscopy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

The crystallinity and surface morphology of zinc octaethylporphyrin thin films on an indium-tin-oxide substrate. / Ryuzaki, Soh; Onoe, J.

In: Journal of Applied Physics, Vol. 103, No. 3, 033516, 22.02.2008.

Research output: Contribution to journalArticle

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