The observation of the lattice defect formation during the hydrogenation and dehydrogenation in La(Ni,Sn)5 by in-situ positron lifetime measurement

Kouji Sakaki, Yumiko Nakamura, Yasuharu Shirai, Robert C. Bowman, Etsuo Akiba

Research output: Contribution to journalConference article

2 Citations (Scopus)

Abstract

To clarify the effect of Sn substitution for Ni of LaNi5 on the lattice defect formation during the hydrogenation and dehydrogenation processes, in-situ positron lifetime measurements were performed in LaNi 4.93Sn0.27. During the hydrogenation, the mean positron lifetime, τm, monotonically increased up to 175 ps which is almost same as calculated positron lifetime for vacancy. This shows vacancy introduction by hydrogenation. The τm decreased down to 135 ps with hydrogen content during the dehydrogenation. It shows that the vacancies are removed from the lattice during the dehydrogenation. These results show that vacancies in LaNi4.93Sn0.27 are introduced and removed reversibly during the hydrogenation and dehydrogenation. The concentrations of vacancy and dislocation were 1 × 10-5 and 6 × 109 cm-2, respectively. These values are two orders lower than those in LaNi5.

Original languageEnglish
Pages (from-to)175-180
Number of pages6
JournalMaterials Research Society Symposium Proceedings
Volume885
Publication statusPublished - Aug 25 2006
Event2005 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 28 2005Dec 2 2005

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'The observation of the lattice defect formation during the hydrogenation and dehydrogenation in La(Ni,Sn)<sub>5</sub> by in-situ positron lifetime measurement'. Together they form a unique fingerprint.

  • Cite this