Fingerprint
Dive into the research topics of 'The origin of gate bias stress instability and hysteresis in monolayer WS2 transistors'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
The origin of gate bias stress instability and hysteresis in monolayer WS2 transistors
Changyong Lan, Xiaolin Kang, You Meng, Renjie Wei, Xiuming Bu, Sen Po Yip, Johnny C. Ho
Research output: Contribution to journal › Article › peer-review
8
Citations
(Scopus)