The postspinel phase boundary in Mg2SiO4 determined by in situ X-ray diffraction

Tetsuo Irifune, Norimasa Nishiyama, Koji Kuroda, Toru Inoue, Maiko Nishibori, Wataru Utsumi, Ken Ichi Funakoshi, Satoru Urakawa, Takeyuki Uchida, Tomoo Katsura, Osamu Ohtaka

Research output: Contribution to journalArticle

218 Citations (Scopus)

Abstract

The phase boundary between spinel (γ phase) and MgSiO3 perovskite + MgO periclase in Mg2SiO4 was determined by in situ x-ray measurements by a combination of the synchrotron radiation source (SPring-8) and a large multianvil high-pressure apparatus. The boundary was determined at temperatures between 1400°to 1800°C, demonstrating that the postspinel phase boundary has a negative Clapeyron slope as estimated by quench experiments and thermodynamic analyses. The boundary was located at 21.1 (± 0.2) gigapascals, at 1600°C, which is ~2 gigapascals lower than earlier estimates based on other high-pressure studies.

Original languageEnglish
Pages (from-to)1698-1700
Number of pages3
JournalScience
Volume279
Issue number5357
DOIs
Publication statusPublished - Mar 13 1998
Externally publishedYes

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X-ray diffraction
periclase
perovskite
spinel
thermodynamics
in situ
experiment
temperature

All Science Journal Classification (ASJC) codes

  • General

Cite this

Irifune, T., Nishiyama, N., Kuroda, K., Inoue, T., Nishibori, M., Utsumi, W., ... Ohtaka, O. (1998). The postspinel phase boundary in Mg2SiO4 determined by in situ X-ray diffraction. Science, 279(5357), 1698-1700. https://doi.org/10.1126/science.279.5357.1698

The postspinel phase boundary in Mg2SiO4 determined by in situ X-ray diffraction. / Irifune, Tetsuo; Nishiyama, Norimasa; Kuroda, Koji; Inoue, Toru; Nishibori, Maiko; Utsumi, Wataru; Funakoshi, Ken Ichi; Urakawa, Satoru; Uchida, Takeyuki; Katsura, Tomoo; Ohtaka, Osamu.

In: Science, Vol. 279, No. 5357, 13.03.1998, p. 1698-1700.

Research output: Contribution to journalArticle

Irifune, T, Nishiyama, N, Kuroda, K, Inoue, T, Nishibori, M, Utsumi, W, Funakoshi, KI, Urakawa, S, Uchida, T, Katsura, T & Ohtaka, O 1998, 'The postspinel phase boundary in Mg2SiO4 determined by in situ X-ray diffraction', Science, vol. 279, no. 5357, pp. 1698-1700. https://doi.org/10.1126/science.279.5357.1698
Irifune, Tetsuo ; Nishiyama, Norimasa ; Kuroda, Koji ; Inoue, Toru ; Nishibori, Maiko ; Utsumi, Wataru ; Funakoshi, Ken Ichi ; Urakawa, Satoru ; Uchida, Takeyuki ; Katsura, Tomoo ; Ohtaka, Osamu. / The postspinel phase boundary in Mg2SiO4 determined by in situ X-ray diffraction. In: Science. 1998 ; Vol. 279, No. 5357. pp. 1698-1700.
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