The response of microwave reflectometry under generalized configuration

A. Ejiri, Takuma Yamada, Y. Adachi, O. Watanabe, Y. Takase

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The response of microwave reflectometry for various configurations is studied theoretically. Based on the Kirchhoff integral (i.e. physical optics), analytic formulae for the measured electric field are obtained. Phase and power sensitivities for weak fluctuations are derived. It was found that the effective spot size, which is a combination of the real spot size and the Fresnel zone, of the launching and the receiving beams is an important parameter, determining the sensitivities. Fringe jump and phase runaway phenomena are attributed to two parameters: one is proportional to the normalized wavenumber of the fluctuations, and the other is proportional to the plasma shift (i.e. misalignment). In the case of frozen turbulence, a complex power spectrum of the measured field becomes a universal quantity, because of easy correction of the configuration effect. Using this feature, an ideal complex amplitude signal (i.e. free from diffraction effects) can be reconstructed.

Original languageEnglish
Article number065003
JournalPlasma Physics and Controlled Fusion
Volume50
Issue number6
DOIs
Publication statusPublished - Jun 1 2008
Externally publishedYes

Fingerprint

Physical optics
Launching
Power spectrum
Turbulence
Diffraction
Microwaves
Electric fields
Plasmas
microwaves
physical optics
launching
sensitivity
configurations
misalignment
power spectra
turbulence
electric fields
shift
diffraction

All Science Journal Classification (ASJC) codes

  • Nuclear Energy and Engineering
  • Condensed Matter Physics

Cite this

The response of microwave reflectometry under generalized configuration. / Ejiri, A.; Yamada, Takuma; Adachi, Y.; Watanabe, O.; Takase, Y.

In: Plasma Physics and Controlled Fusion, Vol. 50, No. 6, 065003, 01.06.2008.

Research output: Contribution to journalArticle

Ejiri, A. ; Yamada, Takuma ; Adachi, Y. ; Watanabe, O. ; Takase, Y. / The response of microwave reflectometry under generalized configuration. In: Plasma Physics and Controlled Fusion. 2008 ; Vol. 50, No. 6.
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