Theoretical analysis of E-J characteristics in a Bi-2223 silver-sheathed tape

T. Kodama; M. Fukuda; S. Nishimura; E. S. Otabe; M. Kiuchi; T. Kiss; T. Matsushita; K. Itoh

doi:10.1016/S0921-4534(02)01499-5

Theoretical analysis of E-J characteristics in a Bi-2223 silver-sheathed tape

T. Kodama, M. Fukuda, S. Nishimura, E. S. Otabe, M. Kiuchi, T. Kiss, T. Matsushita, K. Itoh

Section of Measurement and Control Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

From an analysis of E-J curves with the aid of the flux creep-flow model, it is found that most of the electric field is caused by the flux creep even in the range of electric field in usual resistive measurement. This result is consistent with the fact that the mechanism of flux creep generally explains various phenomena such as the critical current density, the irreversibility field and so on. On the other hand, it is much easier to use the parameters used in the percolation flow model to describe the E-J characteristics phenomenologically. The two models are compared and it is found that the two models are consistent. This gives a theoretical proof for the parameters of the percolation flow model.

Original language	English
Pages (from-to)	575-579
Number of pages	5
Journal	Physica C: Superconductivity and its applications
Volume	378-381
Issue number	PART 1
DOIs	https://doi.org/10.1016/S0921-4534(02)01499-5
Publication status	Published - Oct 1 2002

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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title = "Theoretical analysis of E-J characteristics in a Bi-2223 silver-sheathed tape",

abstract = "From an analysis of E-J curves with the aid of the flux creep-flow model, it is found that most of the electric field is caused by the flux creep even in the range of electric field in usual resistive measurement. This result is consistent with the fact that the mechanism of flux creep generally explains various phenomena such as the critical current density, the irreversibility field and so on. On the other hand, it is much easier to use the parameters used in the percolation flow model to describe the E-J characteristics phenomenologically. The two models are compared and it is found that the two models are consistent. This gives a theoretical proof for the parameters of the percolation flow model.",

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AU - Kodama, T.

AU - Fukuda, M.

AU - Nishimura, S.

AU - Otabe, E. S.

AU - Kiuchi, M.

AU - Kiss, T.

AU - Matsushita, T.

AU - Itoh, K.

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AB - From an analysis of E-J curves with the aid of the flux creep-flow model, it is found that most of the electric field is caused by the flux creep even in the range of electric field in usual resistive measurement. This result is consistent with the fact that the mechanism of flux creep generally explains various phenomena such as the critical current density, the irreversibility field and so on. On the other hand, it is much easier to use the parameters used in the percolation flow model to describe the E-J characteristics phenomenologically. The two models are compared and it is found that the two models are consistent. This gives a theoretical proof for the parameters of the percolation flow model.

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