Abstract
From an analysis of E-J curves with the aid of the flux creep-flow model, it is found that most of the electric field is caused by the flux creep even in the range of electric field in usual resistive measurement. This result is consistent with the fact that the mechanism of flux creep generally explains various phenomena such as the critical current density, the irreversibility field and so on. On the other hand, it is much easier to use the parameters used in the percolation flow model to describe the E-J characteristics phenomenologically. The two models are compared and it is found that the two models are consistent. This gives a theoretical proof for the parameters of the percolation flow model.
| Original language | English |
|---|---|
| Pages (from-to) | 575-579 |
| Number of pages | 5 |
| Journal | Physica C: Superconductivity and its applications |
| Volume | 378-381 |
| Issue number | PART 1 |
| DOIs | |
| Publication status | Published - Oct 1 2002 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
Cite this
Theoretical analysis of E-J characteristics in a Bi-2223 silver-sheathed tape. / Kodama, T.; Fukuda, M.; Nishimura, S.; Otabe, E. S.; Kiuchi, M.; Kiss, Takanobu; Matsushita, T.; Itoh, K.
In: Physica C: Superconductivity and its applications, Vol. 378-381, No. PART 1, 01.10.2002, p. 575-579.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Theoretical analysis of E-J characteristics in a Bi-2223 silver-sheathed tape
AU - Kodama, T.
AU - Fukuda, M.
AU - Nishimura, S.
AU - Otabe, E. S.
AU - Kiuchi, M.
AU - Kiss, Takanobu
AU - Matsushita, T.
AU - Itoh, K.
PY - 2002/10/1
Y1 - 2002/10/1
N2 - From an analysis of E-J curves with the aid of the flux creep-flow model, it is found that most of the electric field is caused by the flux creep even in the range of electric field in usual resistive measurement. This result is consistent with the fact that the mechanism of flux creep generally explains various phenomena such as the critical current density, the irreversibility field and so on. On the other hand, it is much easier to use the parameters used in the percolation flow model to describe the E-J characteristics phenomenologically. The two models are compared and it is found that the two models are consistent. This gives a theoretical proof for the parameters of the percolation flow model.
AB - From an analysis of E-J curves with the aid of the flux creep-flow model, it is found that most of the electric field is caused by the flux creep even in the range of electric field in usual resistive measurement. This result is consistent with the fact that the mechanism of flux creep generally explains various phenomena such as the critical current density, the irreversibility field and so on. On the other hand, it is much easier to use the parameters used in the percolation flow model to describe the E-J characteristics phenomenologically. The two models are compared and it is found that the two models are consistent. This gives a theoretical proof for the parameters of the percolation flow model.
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UR - http://www.scopus.com/inward/citedby.url?scp=0036785705&partnerID=8YFLogxK
U2 - 10.1016/S0921-4534(02)01499-5
DO - 10.1016/S0921-4534(02)01499-5
M3 - Article
VL - 378-381
SP - 575
EP - 579
JO - Physica C: Superconductivity and its Applications
JF - Physica C: Superconductivity and its Applications
SN - 0921-4534
IS - PART 1
ER -