Theoretical analysis of E-J characteristics in a Bi-2223 silver-sheathed tape

T. Kodama, M. Fukuda, S. Nishimura, E. S. Otabe, M. Kiuchi, T. Kiss, T. Matsushita, K. Itoh

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Abstract

From an analysis of E-J curves with the aid of the flux creep-flow model, it is found that most of the electric field is caused by the flux creep even in the range of electric field in usual resistive measurement. This result is consistent with the fact that the mechanism of flux creep generally explains various phenomena such as the critical current density, the irreversibility field and so on. On the other hand, it is much easier to use the parameters used in the percolation flow model to describe the E-J characteristics phenomenologically. The two models are compared and it is found that the two models are consistent. This gives a theoretical proof for the parameters of the percolation flow model.

Original languageEnglish
Pages (from-to)575-579
Number of pages5
JournalPhysica C: Superconductivity and its applications
Volume378-381
Issue numberPART 1
DOIs
Publication statusPublished - Oct 1 2002

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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