Thickness dependence of ac losses in circular disks of YBa2Cu3O7 films in perpendicular magnetic fields

M. Suenaga, Q. Li, Z. Ye, Masataka Iwakuma, K. Toyota, F. Funaki, S. R. Foltyn, H. Wang, John R. Clem

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

The continued development of so-called "coated conductors" using a high-critical-temperature superconductor, YBa2Cu3O7(YBCO), a number of applications are being planned using these conductors. As such, the calculated losses based on the Bean critical-current model are shown to agree well with the measured ones at low fields. This paper reports on measurements of the losses in YBCO films in perpendicular ac fields as a function of film thickness from 0.2 to 3.0 μm, and on analysis of the losses using the given theories.

Original languageEnglish
Pages (from-to)208-213
Number of pages6
JournalJournal of Applied Physics
Volume95
Issue number1
DOIs
Publication statusPublished - Jan 1 2004

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conductors
magnetic fields
critical current
critical temperature
film thickness

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Thickness dependence of ac losses in circular disks of YBa2Cu3O7 films in perpendicular magnetic fields. / Suenaga, M.; Li, Q.; Ye, Z.; Iwakuma, Masataka; Toyota, K.; Funaki, F.; Foltyn, S. R.; Wang, H.; Clem, John R.

In: Journal of Applied Physics, Vol. 95, No. 1, 01.01.2004, p. 208-213.

Research output: Contribution to journalArticle

Suenaga, M, Li, Q, Ye, Z, Iwakuma, M, Toyota, K, Funaki, F, Foltyn, SR, Wang, H & Clem, JR 2004, 'Thickness dependence of ac losses in circular disks of YBa2Cu3O7 films in perpendicular magnetic fields', Journal of Applied Physics, vol. 95, no. 1, pp. 208-213. https://doi.org/10.1063/1.1630695
Suenaga, M. ; Li, Q. ; Ye, Z. ; Iwakuma, Masataka ; Toyota, K. ; Funaki, F. ; Foltyn, S. R. ; Wang, H. ; Clem, John R. / Thickness dependence of ac losses in circular disks of YBa2Cu3O7 films in perpendicular magnetic fields. In: Journal of Applied Physics. 2004 ; Vol. 95, No. 1. pp. 208-213.
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