Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars

M. Zhang; Y. Nozaki; K. Matsuyama

doi:10.1109/intmag.2005.1464305

Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars

M. Zhang, Y. Nozaki, K. Matsuyama

Electronic Devices

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	INTERMAG ASIA 2005
Subtitle of host publication	Digests of the IEEE International Magnetics Conference
Publisher	IEEE Computer Society
Pages	1743-1744
Number of pages	2
ISBN (Print)	0780390091, 9780780390096
DOIs	https://doi.org/10.1109/intmag.2005.1464305
Publication status	Published - 2005
Event	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference - Nagoya, Japan Duration: Apr 4 2005 → Apr 8 2005

Publication series

Name	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

Other

Other	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference
Country/Territory	Japan
City	Nagoya
Period	4/4/05 → 4/8/05

All Science Journal Classification (ASJC) codes

Engineering(all)

Access to Document

10.1109/intmag.2005.1464305

Cite this

Zhang, M., Nozaki, Y., & Matsuyama, K. (2005). Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars. In INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference (pp. 1743-1744). [GS 01] (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference). IEEE Computer Society. https://doi.org/10.1109/intmag.2005.1464305

Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars. / Zhang, M.; Nozaki, Y.; Matsuyama, K.

INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. IEEE Computer Society, 2005. p. 1743-1744 GS 01 (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Zhang, M, Nozaki, Y & Matsuyama, K 2005, Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars. in INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference., GS 01, INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, IEEE Computer Society, pp. 1743-1744, INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, Nagoya, Japan, 4/4/05. https://doi.org/10.1109/intmag.2005.1464305

Zhang M, Nozaki Y, Matsuyama K. Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars. In INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. IEEE Computer Society. 2005. p. 1743-1744. GS 01. (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference). doi: 10.1109/intmag.2005.1464305

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Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars

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Other

All Science Journal Classification (ASJC) codes

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