Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm

Yoshitaka Aoki, H. Habazaki, Toyoki Kunitake

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

AlxSi1-x On films exhibit a drastic change of proton conductivity across the film by reducing their thickness to less than 100 nm. The temperature and humidity dependence of conductivity of the sub- 100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-x On films increases with decreasing the thickness.

Original languageEnglish
Pages (from-to)P13-P16
JournalElectrochemical and Solid-State Letters
Volume11
Issue number11
DOIs
Publication statusPublished - Sep 22 2008
Externally publishedYes

Fingerprint

Proton conductivity
Aluminosilicates
conductivity
protons
Thick films
thick films
Film thickness
humidity
Atmospheric humidity
film thickness
scaling
temperature dependence
aluminosilicate
Temperature

All Science Journal Classification (ASJC) codes

  • Chemical Engineering(all)
  • Materials Science(all)
  • Physical and Theoretical Chemistry
  • Electrochemistry
  • Electrical and Electronic Engineering

Cite this

Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm. / Aoki, Yoshitaka; Habazaki, H.; Kunitake, Toyoki.

In: Electrochemical and Solid-State Letters, Vol. 11, No. 11, 22.09.2008, p. P13-P16.

Research output: Contribution to journalArticle

Aoki, Yoshitaka ; Habazaki, H. ; Kunitake, Toyoki. / Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm. In: Electrochemical and Solid-State Letters. 2008 ; Vol. 11, No. 11. pp. P13-P16.
@article{2f2bfacc8f074582acda02dc4bd46a8c,
title = "Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm",
abstract = "AlxSi1-x On films exhibit a drastic change of proton conductivity across the film by reducing their thickness to less than 100 nm. The temperature and humidity dependence of conductivity of the sub- 100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-x On films increases with decreasing the thickness.",
author = "Yoshitaka Aoki and H. Habazaki and Toyoki Kunitake",
year = "2008",
month = "9",
day = "22",
doi = "10.1149/1.2976305",
language = "English",
volume = "11",
pages = "P13--P16",
journal = "Electrochemical and Solid-State Letters",
issn = "1099-0062",
publisher = "Electrochemical Society, Inc.",
number = "11",

}

TY - JOUR

T1 - Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm

AU - Aoki, Yoshitaka

AU - Habazaki, H.

AU - Kunitake, Toyoki

PY - 2008/9/22

Y1 - 2008/9/22

N2 - AlxSi1-x On films exhibit a drastic change of proton conductivity across the film by reducing their thickness to less than 100 nm. The temperature and humidity dependence of conductivity of the sub- 100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-x On films increases with decreasing the thickness.

AB - AlxSi1-x On films exhibit a drastic change of proton conductivity across the film by reducing their thickness to less than 100 nm. The temperature and humidity dependence of conductivity of the sub- 100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-x On films increases with decreasing the thickness.

UR - http://www.scopus.com/inward/record.url?scp=51849161566&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=51849161566&partnerID=8YFLogxK

U2 - 10.1149/1.2976305

DO - 10.1149/1.2976305

M3 - Article

AN - SCOPUS:51849161566

VL - 11

SP - P13-P16

JO - Electrochemical and Solid-State Letters

JF - Electrochemical and Solid-State Letters

SN - 1099-0062

IS - 11

ER -